Estimating wear of non-volatile, solid state memory
AssigneeSeagate Technology LLC
InventorsRyan James Goss, David Scott Seekins, David Scott Ebsen, Navneeth Kankani
Life of this patent
Estimating the term…
Abstract
Completion times of data storage operations targeted to a non-volatile, solid-state memory device are measured. Wear of the memory device is estimated using the measured completion times, and life cycle management operations are performed to affect subsequent wear of the memory device in accordance with the estimated wear. The life cycle management may include operations such as wear leveling, predicting an end of service life of the memory device, and removing worn blocks of the memory device from service.
Claims18
An apparatus comprising:
- a controller capable of being coupled to a non-volatile, solid-state memory device, the controller configured to cause the apparatus to:
- measure completion times of data storage operations targeted to the memory device;
- compare an average and a confidence interval of the measured completion times with a baseline average and a baseline confidence interval of baseline completion times for other equivalent memory devices to estimate wear of the memory device;
- and
- perform life cycle management operations to affect subsequent wear of the memory device in accordance with the estimated wear.
A method comprising:
- measuring completion times of data storage operations targeted to a non-volatile, solid-state memory device;
- comparing an average and a confidence interval of the measured completion times with a baseline average and a baseline confidence interval of baseline completion times for other equivalent memory devices to estimate wear of the memory device;
- and
- performing life cycle management operations to affect subsequent wear of the memory device in accordance with the estimated wear.
A system comprising:
- a non-volatile, solid-state memory device;
- and a controller coupled to the memory device and configured to cause an apparatus to:
- measure completion times of programming operations targeted to units of the memory device;
- compare an average and a confidence interval of the measured completion times with a baseline average and a baseline confidence interval of baseline completion times for other equivalent memory devices to determine wear metrics of the targeted units, wherein the wear metrics includes at least program-erase cycles applied to the targeted units
- adjust the wear metrics of the targeted memory units using the measured completion times;
- and
- manage a life cycle of the memory device using the adjusted wear metrics.
Dependencies are inferred from the claim text.