Power switching for electronic device test equipment

A method of power switching in a system for testing a battery-powered electronic device-under-test (DUT), the system including a transport frame and a test fixture arranged to receive the transport frame and to test the DUT when the transport frame is engaged with the test fixture, the method comprising:

• providing power to the DUT in a pre-testing stage via a transport frame power supply when the DUT is housed in the transport frame;
• switching from the transport frame power supply to a test fixture power supply in response to a first power switching signal indicating satisfaction of the pre-testing condition;
• and
• switching from the test fixture power supply to the transport frame power supply in response to receiving a second power switching signal indicating completion of the testing stage, the transport frame power supply being separately capable of powering the DUT from the text fixture power supply that is separately capable of powering the DUT from the transport frame power supply.

A system for testing a battery-powered electronic device-under-test (DUT), comprising:

• a transport frame arranged to receive the DUT;
• a transport frame power supply arranged to provide power to the DUT in a pre-testing stage;
• a test fixture arranged to receive the transport frame and to test the DUT when the transport frame is engaged with the test fixture;
• a test fixture power supply arranged to provide power to the DUT after satisfaction of a pre-testing condition, the transport frame power supply being separately capable of powering the DUT from the text fixture power supply that is separately capable of powering the DUT from the transport frame power supply;
• and
• a switching circuit arranged to switch from the transport frame power supply to the test fixture power supply in response to receiving a first power switching signal indicating satisfaction of the pre-testing condition, and arranged to switch from the test fixture power supply to the transport frame power supply in response to receiving a second power switching signal indicating completion of the testing stage.