Correction of variable offsets relying upon scene
AssigneeRaytheon Company
InventorsBradley A. Flanders, Ian S. Robinson
Life of this patent
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AssigneeRaytheon Company
InventorsBradley A. Flanders, Ian S. Robinson
Estimating the term…
In accordance with various aspects of the disclosure, a method, system, and computer readable media having instructions for processing images is disclosed. For example, the method includes determining a suspicious pixel suspected of causing an artifact in a measurement as a function of a statistical analysis of a collection of samples representing residual error values associated with a subject focal plane pixel measuring one waveband at different times. Based on the determination of the suspicious pixel, a pattern of residual error values is identified that is indicative of the artifact caused by the suspicious pixel. A correcting time-dependent offset determined that is substantially reciprocal to the identified pattern of residual error values. The correcting time-dependent offset is applied to the measurement to correct for artifact in the measurement.
A method for correcting an artifact in a measurement caused by a pixel in a focal plane array randomly changing offset level, the method comprising:
An image processing system comprising:
A non-transitory computer readable storage medium storing computer readable instructions for processing images, which when executed by one or more processors cause the one or more processors to:
Dependencies are inferred from the claim text.