Non-contact measurement apparatus and method
AssigneeRenishaw PLC
InventorsNicholas John Weston, Yvonne Ruth Huddart, Andrew John Moore
Life of this patent
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Abstract
A non-contact method and apparatus for inspecting an object. At least one first image of the object on which an optical pattern is projected, taken from a first perspective is obtained. At least one second image of the object on which an optical pattern is projected, taken from a second perspective that is different to the first perspective is obtained. At least one common object feature in each of the at least one first and second images is then determined on the basis of an irregularity in the optical pattern as imaged in the at least one first and second images.
Claims31
A non-contact method for inspecting an object comprising, in any suitable order:
- i) obtaining at least one first image of the object on which an optical pattern is projected, taken from a first perspective;
- ii) obtaining at least one second image of the object on which an optical pattern is projected, taken from a second perspective that is different to the first perspective;
- and
- iii) identifying at least one common object feature in each of the at least one first and second images as a photogrammetric target feature, on the basis of an irregularity in the optical pattern caused by a feature of the object deforming the optical pattern as imaged in the at least one first and second images.
An apparatus for inspecting an object, the apparatus comprising:
- at least one projector configured to project an optical pattern onto an object to be measured;
- at least one imaging device configured to obtain from a first image perspective at least one first image of the object on which an optical pattern is projected and configured to obtain from a second image perspective at least one second image of the object on which an optical pattern is projected;
- and
- an image analyser configured to identify an irregularity in the optical pattern caused by the feature of the object deforming the optical pattern in each of the at least one first and second images as a common object feature that is a photogrammetric target feature.
A computer implemented method comprising:
- receiving first image data representing at least one first image of an object on which an optical pattern is projected, taken from a first perspective;
- receiving second image data representing at least one second image of the object on which an optical pattern is projected, taken from a second perspective that is different to the first perspective;
- and
- analysing the first and second image data to identify at least one common object feature as a photogrammetric target feature, on the basis of an irregularity in the optical pattern caused by a feature of the object deforming the optical system as imaged in the at least one first and second images.
A non-transitory computer-readable storage medium storing a computer program that when executed by a processor device, causes the processor device to execute a non-contact method for inspecting an object comprising, in any suitable order:
- i) obtaining at least one first image of the object on which an optical pattern is projected, taken from a first perspective;
- ii) obtaining at least one second image of the object on which an optical pattern is projected, taken from a second perspective that is different to the first perspective;
- and
- iii) identifying at least one common object feature in each of the at least one first and second images as a photogrammetric target feature, on the basis of an irregularity in the optical pattern caused by a feature of the object deforming the optical pattern as imaged in the at least one first and second images.
Dependencies are inferred from the claim text.