Method for obtaining an item of X-ray-spectrum information about pixels in a grid pattern
AssigneeSiemens Aktiengesellschaft
InventorsFranz Atzinger, Gerhard Hahm, Raphael Henrich, Carsten Illenseer, Christoph Jablonski, Bernhard Sandkamp, Markus Schild, Michael Stark, Fabian Wloka
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