Semiconductor device including test circuit and burn-in test method
AssigneeSK hynix Inc.
InventorJin Hee Cho
Life of this patent
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Abstract
A semiconductor device includes a test circuit configured to generate a buffer control signal in response to input data, decode test commands in response to the buffer control signal, and generate test mode signals and a counting enable signal for counting row addresses and column addresses; and a data input/output circuit configured to buffer external commands in response to the buffer control signal and generate the test commands, perform a burn-in test in response to the test mode signals, and perform a read operation for memory cells corresponding to the row addresses and the column addresses.
Claims16
A semiconductor device comprising:
- a test circuit configured to generate a buffer control signal in response to input data inputted through a data pad, decode test commands inputted in response to the buffer control signal, and generate test mode signals and a counting enable signal for counting row addresses and column addresses;
- and
- a data input/output circuit configured to buffer external commands in response to the buffer control signal and generate the test commands, perform a burn-in test in response to the test mode signals, and perform a read operation for memory cells corresponding to the row addresses and the column addresses.
A test circuit comprising:
- a buffer control signal generation unit configured to generate a buffer control signal in response to input data inputted through a data pad when a burn-in test is performed in an idle state;
- a test command decoder configured to decode inputted test commands in response to the buffer control signal and generate test mode signals and a counting enable signal;
- and
- an address counter configured to count row addresses and column addresses in response to the counting enable signal.
A burn-in test method comprising:
- buffering external commands and outputting test commands, when a semiconductor device is in an idle state and input data inputted through a data pad has a first level;
- decoding the test commands and generating test mode signals and a counting enable signal;
- and
- counting row addresses and column addresses when the counting enable signal is enabled.
Dependencies are inferred from the claim text.