Nonvolatile memory device and related method of operation
AssigneeSamsung Electronics Co., Ltd.
InventorsKi Ho Chung, Sang-Soo Park, Ji-Suk Kim, Doo-Ho Cho
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AssigneeSamsung Electronics Co., Ltd.
InventorsKi Ho Chung, Sang-Soo Park, Ji-Suk Kim, Doo-Ho Cho
Estimating the term…
A method of programming selected memory cells to a plurality of target states comprises applying a first verification voltage to the selected memory cells to perform a verification read operation on memory cells programmed to at least one target state, applying a program voltage to the selected memory cells, and applying a second verification voltage lower than the first verification voltage to the selected memory cells to perform a verification read operation on memory cells programmed to the at least one target state, wherein the second verification voltage is provided in a specified program loop and subsequent program loops. The second verification voltage is set such that a number of slow bits in the at least one target state is different from the number of slow bits in another target state.
A method of programming selected memory cells to a plurality of target states, comprising:
A nonvolatile memory device, comprising:
A method of programming a nonvolatile memory device, comprising:
Dependencies are inferred from the claim text.