Method for the operation of illuminants
AssigneeTridonicAtco GmbH & Co. KG
InventorsStefan Zudrell-Koch, Horst Knoedgen
Life of this patent
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Abstract
The invention relates to the operation of illuminants, in particular OLEDs. The invention relates to a method and a measuring instrument for determining the electrical properties of an OLED, the equivalent circuit diagram of which is composed of the parallel connection of an equivalent diode DE and an equivalent capacitance CE as well as an equivalent resistance RE that is connected in series to said parallel connection. The values for the equivalent resistance RE and the equivalent capacitance CE are determined at a different time than are the values for the equivalent diode DE.
Claims22
A method for determining the electrical properties of an OLED, the equivalent circuit diagram of which includes a parallel connection of an equivalent diode DE and an equivalent capacitor CE, and an equivalent resistor RE connected in series with this parallel connection, comprising:
- measuring a value for the equivalent resistance RE based on the equivalent circuit diagram;
- measuring a value for the equivalent capacitance CE based on the equivalent circuit diagram at least partially concurrently with measuring the value for the equivalent resistance RE;
- and
- measuring, separately from the time of measuring the values of the equivalent resistance RE and the equivalent capacitance CE, values for the equivalent diode DE based on the equivalent circuit diagram;
- wherein the values of the equivalent resistance RE and the equivalent capacitance CE are measured while limiting the voltage drop across the OLED to levels below the voltage at which the equivalent diode DE becomes conducting.
A method for determining the type of an OLED to be operated by an operating device, comprising:
- measuring a plurality of characteristic values of the OLED, wherein the characteristic values correspond to the elements in the equivalent circuit diagram of the OLED, which comprises a parallel connection of an equivalent diode DE and an equivalent capacitor CE and an equivalent resistor RE connected in series with this parallel connection;
- and
- determining the OLED type and/or the OLED dimension on the basis of the measured characteristic values;
- wherein the values of the equivalent resistance RE and the equivalent capacitance CE are measured based on the equivalent circuit diagram and at least partially concurrently,
- wherein the values of the equivalent diode DE are measured based on the equivalent circuit diagram and separately from the time of measuring the values of the values for the equivalent resistance RE and the equivalent capacitance CE and
- wherein the voltage drop across the equivalent diode DE remains below the voltage at which the equivalent diode DE becomes conducting while measuring the characteristic value corresponding to the equivalent capacitor Cr or corresponding to the equivalent resistor RE.
Dependencies are inferred from the claim text.