Semiconductor device and error detector
AssigneeMitsubishi Electric Corporation
InventorHiroshi Nakatake
Life of this patent
Estimating the term…
Loading patent…
AssigneeMitsubishi Electric Corporation
InventorHiroshi Nakatake
Estimating the term…
In a semiconductor device utilizing a power semiconductor element provided with a main cell and a current sensing cell, a load overcurrent is accurately detected and a short circuit current is rapidly detected. The output of a current sensing cell is connected to an inverting input terminal of an operational amplifier, and a non-inverting input terminal of the operational amplifier is connected to the source of the main cell. A current/voltage conversion circuit configured with the operational amplifier and a sensing resistor converts an output current of the current sensing cell into a sensing voltage. A first error detection circuit compares the sensing voltage with a first reference voltage and outputs an error signal. A second error detection circuit compares a voltage at the inverting input terminal of the operational amplifier with a second reference voltage set to be higher than a source-bias voltage and outputs an error signal.
A semiconductor device comprising:
An error detector for detecting an error in a current from a current-detection terminal, the error detector comprising:
A power converter comprising:
Dependencies are inferred from the claim text.