Nonvolatile semiconductor memory device and method of fabricating the same
AssigneeKabushiki Kaisha Toshiba
InventorsTetsuya Kai, Yoshio Ozawa
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AssigneeKabushiki Kaisha Toshiba
InventorsTetsuya Kai, Yoshio Ozawa
Estimating the term…
In one embodiment, a nonvolatile semiconductor memory device includes a substrate; a tunnel insulating film on the substrate; a charge storage layer on the tunnel insulating film; a block insulating film on the charge storage layer; a first element isolation insulating film in an element isolation trench in the substrate, having a bottom surface lower than an interface between the substrate and the tunnel insulating film, and having a top surface lower than an interface between the charge storage layer and the block insulating film; a second element isolation insulating film on the first element isolation insulating film, protruding to a top surface of the block insulating film, in contact with a side surface of the block insulating film, and having a higher Si concentration than the block insulating film; and a control gate electrode on the block insulating film and on the second element isolation insulating film.
A nonvolatile semiconductor memory device comprising:
A method of manufacturing a nonvolatile semiconductor memory device, the method comprising:
Dependencies are inferred from the claim text.