Apparatuses, device, and methods for cleaning tester interface contact elements and support hardware

A cleaning device for cleaning pin contact elements and support hardware in a semiconductor testing apparatus, the cleaning device comprising:

• a cleaning layer with a configuration for the pin contact elements, the cleaning layer having a plurality of geometric micro-features that extend above a surface of the cleaning layer with geometrical and dimensional properties so that a contact area and surrounding support hardware are cleaned without modification or damage and wherein the cleaning layer further comprises a plurality of abrasive particles having a Mohs Hardness of 7 or greater for cleaning contact elements and support structures of testing interfaces;
• a substrate having a configuration to be introduced into the testing apparatus during normal testing operating of the testing apparatus, wherein the substrate comprises a surrogate semiconductor wafer or packaged IC device;
• and
• the cleaning layer, secured to the substrate, having characteristics that clean debris from the pin contact elements and support hardware when the pin contact elements and support hardware contact the cleaning layer so that the pin contact elements and support hardware are cleaned, without modification to normal operation of the testing machine.