Trace/failure observation system, trace/failure observation method, and trace/failure observation program
AssigneeNEC Corporation
InventorsNoriaki Suzuki, Junji Sakai
Life of this patent
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AssigneeNEC Corporation
InventorsNoriaki Suzuki, Junji Sakai
Estimating the term…
There is provided a trace/failure observation system which is capable of comprehensive collection of information that is needed for checking a desired operation in a system or the like where the amount of information to be observed is large, and which allows easy analysis of the desired operation. The system includes, in a system LSI to be subjected to trace/failure observation: an event detecting means for observing behavior of a portion to be observed; a first data reducing means for performing observation data reduction processing so that observation data from the event detecting means has an amount of information processable to a second data reducing means; and the second data reducing means for performing one or more steps of observation data reduction processing.
A trace system arranged in a system LSI (Large Scale Integration) to be subjected to trace, the system comprising:
A trace method to be performed in a system LSI (Large Scale Integration) to be subjected to trace according to program instructions stored in a computer-readable medium, the instructions causing a computer to execute:
A non-transitory computer readable recording medium that records a trace program causing a trace system to execute a process, the trace system being arranged in a system LSI (Large Scale Integration) to be subjected to trace, the process including:
Dependencies are inferred from the claim text.