Rotating array probe system for non-destructive testing

An inspection system for performing non-destructive testing of test object, the inspection system comprising:

• a test object conveyor for conveying the test object along a longitudinal conveyance path;
• at least one probe assembly further including at least one phased-array probe, the phased-array probe being configured to send ultrasonic beams to the test object and to sense echo signals induced in the test object and convert the echoes to electronic response data and a probe assembly conveyor configured to movably support the probe assembly, to move the probe assembly on a circumferential path about the test object;
• at least one data acquisition unit disposed on the probe assembly conveyor which acquires the response data from the phased-array probe, provides phased array firing commands to the phased-array probe in order to apply desired focus angles for the ultrasonic beams for the testing and perform a first part of data processing including producing real-time A-scan data;
• a control and data processing system coupled to the test object conveyor and to the probe assembly conveyor configured to allow data acquisition by and from the phased-array probes while, simultaneously, the test object moves along the longitudinal path and the phased-array probes move on the circumferential path, wherein the probe assembly conveyor includes a first stationary bearing structure which rotatably supports a second rotatable bearing structure, the second bearing structure being configured to support the probe assembly.