Systems and methods for increased specificity in diagnostics
AssigneePacesetter, Inc.
InventorsTaraneh Ghaffari Farazi, Rupinder Bharmi, Brian Jeffrey Wenzel
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Abstract
Methods and apparatuses for monitoring, with improved specificity, occurrences of episodes relating to disorders that are known to affect T-wave morphology. T-wave variability is monitored. When T-wave variability, or a change therein, exceeds a corresponding threshold for a specific period of time, monitoring for a specific change in T-wave morphology that is known to be indicative of episodes relating to a disorder may be triggered.
Claims20
A method for monitoring for episodes relating to a disorder that is known to affect T-wave morphology, the method comprising:
- (a) using a microcontroller to monitor T-wave variability;
- (b) when the T-wave variability exceeds a corresponding threshold for a specific period of time, or a change in the T-wave variability exceeds a corresponding threshold for a specific period of time, using the microcontroller to trigger
- monitoring for a specific change in T-wave morphology that is known to be indicative of episodes relating to the disorder.
A method for monitoring for episodes relating to a disorder that is known to affect T-wave morphology, the method comprising:
- (a) using a microcontroller to monitor T-wave variability;
- (b) when the T-wave variability exceeds a corresponding threshold for a specific period of time, or a change in the T-wave variability exceeds a corresponding threshold for a specific period of time, wherein the specific period of time comprises at least a first window having a duration of about 5 minutes to about one hour, triggering at least one of the following:
- (b.1) an alarm;
- or
- (b.2) using the microcontroller to monitor for a specific change in T-wave morphology that is known to be indicative of episodes relating to the disorder.
A method for monitoring for episodes relating to a disorder that is known to affect T-wave morphology, the method comprising:
- (a) using a microcontroller to monitor T-wave variability, wherein T-wave variability is a measure of one or more T-wave metric selected from the group consisting of:
- area under T-wave,
- slope of T-wave, and
- T-wave centroid;
- (b) when the T-wave variability exceeds a corresponding threshold for a specific period of time, or a change in the T-wave variability exceeds a corresponding threshold for a specific period of time, triggering at least one of the following
- (b.1) an alarm;
- or
- (b.2) using the microcontroller to monitor for a specific change in T-wave morphology that is known to be indicative of episodes relating to the disorder.
Dependencies are inferred from the claim text.