Electronic load for testing voltage stability

An electronic load for testing stability of a power voltage of a power source, comprising:

• a voltage supply device configured to provide a control voltage;
• a field effect transistor (FET) comprising a gate electrode, a source electrode, and a drain electrode, the drain electrode connected to the power source;
• an amplification circuit electrically connected with the voltage supply device and configured to amplify the control voltage from the voltage supply device and drive the FET using the amplified control voltage, the amplification circuit comprising a first input connected to the voltage supply device, a second input connected to the source electrode of the FET, an output connected to the gate electrode of the FET, an operational amplifier, and a feedback resistor, wherein a positive input of the operational amplifier is connected to the first input of the amplification circuit, a negative input of the operational amplifier is connected to the second input of the amplification circuit via the first feedback resistor, and an output of the operational amplifier is connected to the output of the amplification circuit;
• and
• a current sampling resistor comprising one end connected to ground and the other end connected to the source electrode of the FET and the second input of the amplification circuit;
• and
• a first protection circuit detecting an operating temperature of the electronic load and switches off the FET when the operating temperature exceeds a predetermined threshold temperature by adjusting the voltage applied on the positive input of the operational amplifier.