Optical system for inspecting porous substrates
AssigneeGeneral Electric Company
InventorsKevin George Harding, Yana Zhang Williams, Esmaeil Heidari
Life of this patent
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AssigneeGeneral Electric Company
InventorsKevin George Harding, Yana Zhang Williams, Esmaeil Heidari
Estimating the term…
An automated system for inspecting a porous substrate using a sample, comprising, a delivery device positioned to apply the sample to a target point on the porous substrate along a sample axis; an imaging device and one or more lenses, positioned so that the imaging device and the lens each has a focus axis that is offset from the sample axis, and have a viewing focal point that is substantially the same as the target point; a light source that is offset from the delivery device to illuminate the surface target; and a processor comprising a data acquisition and control system that coordinates timing and automation of the delivery and imaging devices, and determines one or more characteristics of the porous substrate.
An automated system for inspecting a porous substrate using a sample, comprising,
Dependencies are inferred from the claim text.