Continuous prediction of expected chip performance throughout the production lifecycle

A system for predicting at least one feature of at least one product being manufactured, the system comprising:

• at least one memory device;
• and
• at least one processor, wherein the processor is configured to receive, from at least one sensor installed in at least one equipment performing one or more manufacturing process steps, at least one measurement of the at least one feature of the at least one product being manufactured;
• select one or more of the at least one received measurement of the at least one feature of the at least one product;
• estimate additional measurements of the at least one feature of the at least one product at a current manufacturing process step;
• create a plurality of computational models for predicting future measurements of the at least one feature of the at least one product, based on the selected measurement and the estimated additional measurements;
• run the plurality of computational models;
• average results of the plurality of computational models, the average of the results representing the predicted future measurements of the least one feature of the at least one product;
• and
• output the predicted future measurements of the at least one feature of the at least one product.

A computer program product for predicting at least one feature of at least one product being manufactured, the computer program product comprising:

• a non-transitory storage medium readable by a processing circuit and storing instructions run by the processing circuit for performing a method, the method comprising:
• receiving, from at least one sensor installed in at least one equipment performing one or more manufacturing process steps, at least one measurement of the at least one feature of the at least one product being manufactured;
• selecting one or more of the at least one received measurement of the at least one feature of the at least one product;
• estimating additional measurements of the at least one product at a current manufacturing process step;
• creating a plurality of computational models for predicting future measurements of the at least one feature of the at least one product, based on the selected measurement and the estimated additional measurements;
• running the plurality of computational models;
• averaging results of the plurality of computational models, the average of the results representing the predicted future measurements of the at least one feature of the product;
• and
• outputting the predicted future measurements of the at least one feature of the at least one product,
• wherein the processing circuit coupled to the non-transitory storage medium is configured to perform:
• the receiving, the selecting, the estimating, the creating, the running, the averaging, and the outputting.