# US 8,786,299 B1 · Adherable holder and locater tool > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 8,786,299 B1 - Document ID: US8786299B1 - Status: Granted - Kind: B1 - Application number: 13/863,338 - Filed: 2013-04-15 - Granted: 2014-07-22 - Earliest claimed: 2005-08-31 - Assignees: Teledyne LeCroy, Inc. - Applicants: Teledyne LeCroy, Inc. - Inventors: Julie A. Campbell - Web page: https://patentgrep.com/patent/US8786299B1 ## CPC - G01R 1/0408: {Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets (G01R1/067 takes precedence; mass production testing systems G01R31/59; testing of connections G01R31/66; for testing printed circuit boards G01R31/2808)} - G01R 1/06705: {Apparatus for holding or moving single probes (for moving multiple probe heads or ICs under test G01R31/2886)} - G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12) ## Abstract An assistive fine positioning support device for positioning and/or holding a test probe tip (the test probe tip being distanced from the probing head). The support device includes at least one positionable support member having a first support end and a second support end. A tip adapter at the first support end is for connecting the test probe tip to the at least one positionable support member, the tip adapter being in direct contact with the test probe tip. The second support end having means for holding and securing to a surface supporting an electrical component to be probed. ## Claims ### Claim 1 An assistive fine positioning support device for positioning and/or holding a test probe tip suitable for making an electrical contact with electrical components, said test probe tip distanced from associated with a probing head of an electrical test probe, the electrical test probe having a cable with the probing head at one end and a testing instrument connector at the other end, the testing instrument connector being suitable for connecting to a testing instrument, the support device comprising: (a) at least one bendable and shape retainable positionable support member having a first support end and a second support end; (b) a tip adapter at said first support end for connecting said test probe tip to said at least one positionable support member, said tip adapter in direct contact with said test probe tip; (c) said second support end having means for holding and securing to a surface supporting an electrical component to be probed; and (d) said test probe tip being remote from said probing head, wherein said assistive fine positioning device supports said test probe tip without supporting said probing head. ### Claim 2 (depends on 1) The support device of claim 1 wherein generally an entire length of said positionable support member is bendable. ### Claim 3 (depends on 1) The support device of claim 1 wherein generally an entire length of said positionable support member is shape retainable. ### Claim 4 (depends on 1) The support device of claim 1 wherein said positionable support member includes a plurality of support member segments and at least one pivot therebetween. ### Claim 5 (depends on 1) The support device of claim 1, said tip adapter being an interchangeable connector that may be removed from said at least one positionable support member. ### Claim 6 (depends on 1) The support device of claim 1, wherein said tip adapter is a fine-positionable tip adapter that can be raised and lowered relative to said support member by twisting a screw. ### Claim 7 (depends on 1) The support device of claim 1, said test probe tip including a first part of a passive two-part connection mechanism, said tip adapter including a second part of said two-part connection mechanism, said first part and said second part being interconnectable. ### Claim 8 (depends on 1) The support device of claim 1, said test probe tip defining a connection void, said tip adapter including a connection protrusion, said connection protrusion being insertable into said connection void. ### Claim 9 (depends on 1) The support device of claim 1, wherein said second support end is adherable to said surface. ### Claim 10 (depends on 1) The support device of claim 1 further comprising adhesive, said adhesive for attaching said second support end to said surface. ### Claim 11 (depends on 1) The support device of claim 1 further comprising removable adhesive, said removable adhesive for attaching said second support end to said surface. ### Claim 12 (depends on 1) The support device of claim 1, wherein said second support end is attachable through said surface. ### Claim 13 (depends on 1) The support device of claim 1, wherein said tip adapter is a fine-positionable tip adapter that can be raised and lowered relative to said support member by twisting a screw. ### Claim 14 (depends on 1) The support device of claim 1, wherein said test probe tip does not include a differential amplifier. ### Claim 15 (depends on 1) The support device of claim 1, wherein said surface is a circuit board. ### Claim 16 An assistive fine positioning device for positioning and/or holding a test probe tip suitable for making an electrical contact with electrical components, said test probe tip distanced from an associated probing head of an electrical test probe, the electrical test probe having a cable with the probing head at one end and a testing instrument connector at the other end, the testing instrument 6 connector being suitable for connecting to a testing instrument, said device comprising: (a) at least one bendable and shape retainable support member having a first support end and a second support end; (b) a tip adapter at said first support end for connecting said at least one support member to said test probe tip, said tip adapter in direct contact with said test probe tip; (c) an adhesive mechanism at said second support end, said adhesive mechanism for attaching said second support end to a surface supporting an electrical component to be probed; and (d) said test probe tip remote being from said probing head, wherein said device supports said test probe tip without supporting said associated probing head. ### Claim 17 (depends on 16) The device of claim 16, wherein said tip adapter is a fine-positionable tip adapter that can be raised and lowered relative to said support member by twisting a screw. ### Claim 18 An assistive fine positioning device for positioning and/or holding a test probe tip suitable for making an electrical contact with electrical components, said test probe tip associated with a probing head of an electrical test probe, the electrical test probe having a cable with the probing head at one end and a testing instrument connector at the other end, the testing instrument connector being suitable for connecting to a testing instrument, said test probe tip defining a connection void, said device comprising: (a) at least one bendable and shape retainable support member having a first support end and a second support end; (b) a tip adapter at said first support end for connecting said at least one support member to said test probe tip, said tip adapter including a connection protrusion, said connection protrusion suitable for mating with said connection void; and (c) an adhesive mechanism at said second support end, said adhesive mechanism for attaching said second support end to a surface supporting an electrical component to be probed; (d) wherein said device supports said test probe tip without supporting said probing head. ### Claim 19 (depends on 1) The support device of claim 1, said test probe tip including a first part of a passive two-part connection mechanism, said tip adapter including a second part of said two-part connection mechanism, said first part and said second part being interconnectable, and said test probe tip further including connection edges along an outer periphery of said test probe tip, said tip adapter further including at least one connection grip suitable for mating with said connection edges. ### Claim 20 (depends on 1) The support device of claim 1, said test probe tip defining a connection void, said tip adapter including a connection protrusion, said connection protrusion is substantially surrounded by an interior wall of the void. ### Claim 21 (depends on 16) The device of claim 16, said test probe tip defining a connection void, said tip adapter including a connection protrusion, said connection protrusion being insertable into said connection void. ### Claim 22 (depends on 18) The device of claim 18, said test probe tip being remote from said probing head.