# US 8,786,237 B2 · Voltage regulator and cooling control integrated circuit

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- Number: US 8,786,237 B2
- Document ID: US8786237B2
- Status: Granted
- Kind: B2
- Application number: 13/755,812
- Filed: 2013-01-31
- Published: 2013-06-13
- Granted: 2014-07-22
- Earliest claimed: 2010-03-19
- Assignees: Renesas Electronics America Inc.
- Applicants: Renesas Electronics America Inc.
- Inventors: Tetsuo Sato; Isao Shimura; Tsutomu Kawano
- Web page: https://patentgrep.com/patent/US8786237B2

## CPC

- G05D 23/1932: {to control the temperature of a plurality of spaces}
- G05D 23/1931: {to control the temperature of one space}
- G05D 23/20: with sensing elements having variation of electric or magnetic properties with change of temperature (G05D23/13 takes precedence)
- G06F 1/206: {comprising thermal management}
- H10W 40/00: Arrangements for thermal protection or thermal control (integrated devices comprising arrangements for thermal protection H10D89/60)
- H10W 40/43: by flowing gases, e.g. forced air cooling
- Y02D 10/00: Energy efficient computing, e.g. low power processors, power management or thermal management
- G05D: SYSTEMS FOR CONTROLLING OR REGULATING NON-ELECTRIC VARIABLES
- G06F: ELECTRIC DIGITAL DATA PROCESSING (computer systems based on specific computational models G06N)
- H10W: GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- Y02D: CLIMATE CHANGE MITIGATION TECHNOLOGIES IN INFORMATION AND COMMUNICATION TECHNOLOGIES [ICT], I.E. INFORMATION AND COMMUNICATION TECHNOLOGIES AIMING AT THE REDUCTION OF THEIR OWN ENERGY USE

## Abstract

According to an embodiment of the invention, an apparatus is provided which includes a microprocessor, and a built-in temperature sensor configured to measure a temperature of the microprocessor as a reference temperature. The apparatus further includes external temperature sensors, where at least one of the external temperature sensors is configured to measure the temperature of the microprocessor. The microprocessor is configured to make an external temperature calibration using the reference temperature measured by the built-in temperature monitor. Each of the external temperature sensors is configured to monitor temperature information of a component and provide the temperature information to the microprocessor.

## Claims

### Claim 1

An apparatus, comprising:
an integrated circuit comprising a microprocessor and a first temperature sensor configured to generate a reference temperature signal corresponding to a temperature of the microprocessor; and
temperature sensors, wherein the temperature sensors are configured to generate respective temperature signals corresponding to respective temperatures of components including the microprocessor,
wherein the microprocessor is configured to make an external temperature calibration using the reference temperature signal, and
wherein the microprocessor is configured to process the temperature signals.

### Claim 2 (depends on 1)

The apparatus of claim 1, further comprising:
a cooling fan motor controller formed on the integrated circuit and configured to control a speed of a fan.

### Claim 3 (depends on 1)

The apparatus of claim 1, further comprising:
a voltage regulator controller formed on the integrated circuit and configured to generate a voltage and provide the voltage to one of the components.

### Claim 4 (depends on 1)

The apparatus of claim 1, further comprising:
a cooling fan motor controller formed on the integrated circuit; and
a voltage regulator controller formed on the integrated circuit,
wherein the microprocessor, cooling fan motor controller, and voltage regulator controller are configured to cause the apparatus to control the temperature of one of the components using one of the temperature signals.

### Claim 5 (depends on 1)

The apparatus of claim 1, wherein the temperature sensors are selectively coupled to the microprocessor via first and second switches.

### Claim 6 (depends on 1)

The apparatus of claim 1, wherein the microprocessor is further configured to scan multiple temperature sensors in a known temperature condition in order to calibrate the multiple temperature sensors.

### Claim 7 (depends on 1)

The apparatus of claim 1, further comprising a diode temperature sensor configured to generate a signal corresponding to a forwarding voltage during production testing for subsequent calibration of the temperature sensors.

### Claim 8

A method comprising:
generating a reference temperature signal corresponding to a temperature of a microprocessor;
generating a plurality of temperature signals corresponding to respective temperatures of components including the microprocessor;
the microprocessor processing the reference temperature signal and at least one temperature signals to make a temperature calibration.

### Claim 9 (depends on 8)

The method of claim 8 further comprising a cooling fan motor controller controlling a speed of a fan.

### Claim 10 (depends on 8)

The method of claim 8 further comprising a voltage regulator controller generating and providing a voltage to one of the components.

### Claim 11 (depends on 1)

The method of claim 1 further comprising the microprocessor scanning multiple temperature sensors in a known temperature condition in order to calibrate the multiple temperature sensors.
