# US 8,772,154 B2 · Integrated circuits including barrier polish stop layers and methods for the manufacture thereof > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 8,772,154 B2 - Document ID: US8772154B2 - Status: Granted - Kind: B2 - Application number: 13/163,495 - Filed: 2011-06-17 - Published: 2012-12-20 - Granted: 2014-07-08 - Earliest claimed: 2011-06-17 - Assignees: Globalfoundries Inc. - Applicants: Egon Ronny Pfützner; Carsten Peters; Jens Heinrich - Inventors: Egon Ronny Pfützner; Carsten Peters; Jens Heinrich - Web page: https://patentgrep.com/patent/US8772154B2 ## CPC - H10W 20/47: comprising two or more dielectric layers having different properties, e.g. different dielectric constants - H10P 50/73: {using masks for insulating materials} - H10P 52/403: {of conductive or resistive materials} - H10W 20/062: {by smoothing of conductive parts, e.g. by planarisation} - H10W 20/425: {Barrier, adhesion or liner layers} - H10W: GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10 - H10P: GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10 ## Abstract Embodiments of a method for fabricating integrated circuits are provided, as are embodiments of an integrated circuit. In one embodiment, the method includes the steps of depositing an interlayer dielectric (“ILD”) layer over a semiconductor device, depositing a barrier polish stop layer over the ILD layer, and patterning at least the barrier polish stop layer and the ILD layer to create a plurality of etch features therein. Copper is plated over the barrier polish stop layer and into the plurality of etch features to produce a copper overburden overlying the barrier polish stop layer and a plurality of conductive interconnect features in the ILD layer and barrier polish stop layer. The integrated circuit is polished to remove the copper overburden and expose the barrier polish stop layer. ## Claims ### Claim 1 A method for manufacturing an integrated circuit, comprising: depositing an interlayer dielectric (“ILD”) layer over a semiconductor device; depositing a barrier polish stop layer over the ILD layer; depositing a capping layer over the barrier polish stop layer; patterning at least the capping layer, the barrier polish stop layer, and the ILD layer to create a plurality of etch features therein; plating metal over the capping layer, the barrier polish stop layer, and into the plurality of etch features to produce a metal overburden overlying the capping layer and the barrier polish stop layer and to produce a plurality of conductive interconnect features in the ILD layer, the barrier polish stop layer, and the capping layer; and chemical mechanical planarizing the integrated circuit to remove the metal overburden and the capping layer and expose the barrier polish stop layer, wherein chemical mechanical planarizing comprises: removing the bulk of the metal overburden utilizing a first polish platen; clearing any remaining metal overburden from over the capping layer utilizing a second polish platen; and removing the capping layer and a portion of the conductive interconnect features utilizing a third polish platen to expose the barrier polish stop layer. ### Claim 2 (depends on 1) A method according to claim 1 wherein depositing a barrier polish stop layer comprises forming a barrier polish stop layer over the ILD layer by depositing a material having a rate of removal less than the rate of removal of the capping layer during polishing. ### Claim 3 (depends on 1) A method according to claim 1 wherein chemical mechanical planarizing comprises chemical mechanical planarizing the integrated circuit to remove the metal overburden, the capping layer, and less than about 10 nanometers of thickness from the barrier polish stop layer. ### Claim 4 (depends on 1) A method according to claim 1 wherein depositing a barrier polish stop layer over the ILD layer comprises depositing a barrier polish stop layer to a thickness between about 10 nanometers and about 30 nanometers. ### Claim 5 (depends on 1) A method according to claim 1 wherein depositing a barrier polish stop layer comprises forming a barrier polish stop layer over the ILD layer by depositing a material selected from the group consisting of an ultralow-k material and an oxide-based material. ### Claim 6 (depends on 1) A method according to claim 1 wherein depositing a barrier polish stop layer comprises forming a barrier polish stop layer over the ILD layer by depositing a material having a carbon content greater than about 150 parts per million. ### Claim 7 (depends on 6) A method according to claim 6 wherein depositing the barrier polish stop layer comprises forming a barrier polish stop layer over the ILD layer by depositing a material having a carbon content less than about 300 parts per million. ### Claim 8 (depends on 5) A method according to claim 5 wherein depositing a barrier polish stop layer comprises forming a barrier polish stop layer over the ILD layer utilizing a pre-cursor material comprising diethoxymethylsilane. ### Claim 9 (depends on 8) A method according to claim 8 wherein forming a barrier polish stop layer over the ILD layer comprises forming a barrier polish stop layer over the ILD layer utilizing a pre-cursor material comprising diethoxymethylsilane deposited with a selected porogen. ### Claim 10 (depends on 1) A method according to claim 1 further comprising forming an etch stop layer over the barrier polish stop layer after polishing the integrated circuit to remove the metal overburden and expose the barrier polish stop layer. ### Claim 11 A method for manufacturing an integrated circuit, comprising: providing a partially-fabricated integrated circuit comprising a semiconductor device, an interlayer dielectric (“ILD”) layer overlaying the semiconductor device, a capping layer overlaying the ILD layer, and a barrier polish stop layer disposed between the ILD layer and the capping layer; forming a plurality of contact openings through the capping layer, the barrier polish stop layer, and the ILD layer; plating copper over the capping layer and into the plurality of contact openings to produce a copper overburden overlying the capping layer and to produce a plurality of copper contacts extending through the capping layer, the barrier polish stop layer, and the ILD layer; and subjecting the partially-fabricated integrated circuit to a chemical mechanical planarization (“CMP”) process comprising: removing the bulk of the copper overburden utilizing a first polish platen; clearing any remaining copper overburden from over the capping layer utilizing a second polish platen; and removing the capping layer, a portion of the copper contacts, and a portion of barrier polish stop layer utilizing a third polish platen while leaving intact the majority of the barrier polish stop layer and the entirety of the ILD layer. ### Claim 12 (depends on 11) A method according to claim 11 wherein removing the capping layer, a portion of the copper contacts, and a portion of barrier polish stop layer comprises removing the capping layer, a portion of the copper contacts, and less than 10 nanometers of thickness from barrier polish stop layer utilizing a third polish platen. ### Claim 13 (depends on 11) A method according to claim 11 further comprising forming an etch stop layer over the barrier polish stop layer after subjecting the partially-fabricated integrated circuit to the CMP process. ### Claim 14 (depends on 11) A method according to claim 11 wherein depositing a polish-resistant material having a carbon content exceeding about 150 parts per million comprises depositing a polish-resistant material having a carbon content exceeding about 150 parts per million to form a barrier polish stop layer over the ILD layer, the barrier polish stop layer having a thickness between about 10 nanometer and 30 nanometers. ### Claim 15 (depends on 14) A method according to claim 14 wherein depositing a polish-resistant material having a carbon content exceeding about 150 parts per million comprises depositing a polish-resistant material having a carbon content exceeding about 150 parts per million to form a barrier polish stop layer over the ILD layer, the barrier polish stop layer selected from the group consisting of an ultralow-k material and an oxide-based material.