Apparatus and method for analyzing and modifying a specimen surface

A probe assembly, comprising:

• a first probe, the first probe having a neutral position in which the first probe does not interact a specimen, and the first probe having a working position in which the first probe is configured to analyze the specimen;
• a second probe, the second probe having a neutral position in which the second probe does not interact with the specimen, and the second probe having a working position in which the second probe is configured to modify the specimen;
• and
• a motion element configured to scan the first probe across a surface of the specimen when the first probe is in its working position and the second probe is in its neutral position, the motion element also being configured to bring the second probe into its working position so that a region of the specimen analyzed with the first probe is modifiable with the second probe,
• wherein the probe assembly is a scanning probe microscope probe assembly.