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US 8,767,915 B2Granted
Differential phase contrast X-ray imaging system and components
AssigneeThe Johns Hopkins University
InventorsDaniel Stutman, Michael Finkenthal
Life of this patent
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Abstract
A differential phase contrast X-ray imaging system includes an X-ray illumination system, a beam splitter arranged in an optical path of the X-ray illumination system, and a detection system arranged in an optical path to detect X-rays after passing through the beam splitter.
Claims17
A differential phase contrast X-ray imaging system, comprising:
- an X-ray illumination system;
- a beam splitter arranged in an optical path of said X-ray illumination system;
- and
- a detection system arranged in an optical path to detect X-rays after passing through said beam splitter, said detection system comprising an X-ray detection component,
- wherein said beam splitter comprises a splitter grating arranged to intercept an incident X-ray beam and provide an interference pattern of X-rays,
- wherein said detection system comprises an analyzer grating arranged to intercept and block at least portions of said interference pattern of X-rays prior to reaching said X-ray detection component,
- wherein said analyzer grating has a longitudinal dimension, a lateral dimension that is orthogonal to said longitudinal dimension and a transverse dimension that is orthogonal to said longitudinal and lateral dimensions, said analyzer grating comprising a pattern of optically dense regions each having a longest dimension along said longitudinal dimension and being spaced substantially parallel to each other in said lateral dimension such that there are optically rare regions between adjacent optically dense regions,
- wherein each optically dense region has a depth in said transverse dimension that is smaller than a length in said longitudinal dimension,
- wherein said analyzer grating is arranged with said longitudinal dimension at a shallow angle relative to incident X-rays, and
- wherein said shallow angle is less than 30 degrees.
7 more elements
An X-ray illumination system, comprising:
- a poly-energetic X-ray source;
- and
- a band-pass filter arranged in an optical path of X-rays from said poly-energetic X-ray source,
- wherein said band-pass filter allows X-rays within a band of energies to pass more strongly than X-rays outside said band of energies,
- wherein said band-pass filter comprises:
- a high-pass X-ray mirror that reflects a first portion of an incident beam of X-rays that have energies less than a lower pass-band energy and allows a second portion of said incident beam of X-rays to pass therethrough,
- a first beam stop arranged to intercept and at least attenuate said first portion of said incident beam of X-rays that have energies less than said lower pass-band energy,
- a low-pass X-ray mirror that reflects a portion of said second portion of said incident beam of X-rays after passing through said high-pass X-ray mirror that have energies less than a upper pass-band energy, and
- a second beam stop arranged to intercept and at least attenuate X-rays that miss said high-pass X-ray mirror prior to reaching said second beam stop, and
- wherein said first and second beam stops are arranged to allow a beam of X-rays having energies between said upper pass-band energy and said lower pass-band energy to pass therethrough.
7 more elements
Dependencies are inferred from the claim text.