# US 8,740,342 B2 · Test apparatus for liquid drop emission apparatus

> Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt

- Number: US 8,740,342 B2
- Document ID: US8740342B2
- Status: Granted
- Kind: B2
- Application number: 13/742,139
- Filed: 2013-01-15
- Published: 2013-07-25
- Granted: 2014-06-03
- Earliest claimed: 2012-01-23
- Assignees: Seiko Epson Corporation
- Applicants: Seiko Epson Corporation
- Inventors: Koji Kitazawa
- Web page: https://patentgrep.com/patent/US8740342B2

## CPC

- B41J 2/12: testing or correcting charge or deflection
- B41J 2/0451: {for detecting failure, e.g. clogging, malfunctioning actuator}
- B41J 2/04541: {Specific driving circuit}
- B41J 2/04581: {controlling heads based on piezoelectric elements}
- B41J 2/04596: {Non-ejecting pulses}
- B41J: TYPEWRITERS; SELECTIVE PRINTING MECHANISMS, i.e. MECHANISMS PRINTING OTHERWISE THAN FROM A FORME; CORRECTION OF TYPOGRAPHICAL ERRORS

## Abstract

A test apparatus for a liquid drop emission apparatus having a plurality of emission mechanisms, the emission mechanisms each having a driving element configured to emit an ink drop from a nozzle, and an application switch coupled with a driving voltage source and the driving element in series, the application switch being configured to switch a driving voltage for emission of a liquid drop between being applied and not being applied to the driving element, the test apparatus including a test switch configured to make each of the emission mechanisms output a test voltage which appears between both ends of the application switch to a test terminal, the test apparatus including a failure deciding section configured to decide whether the emission mechanism is in failure or not on the basis of the test voltage outputted to the test terminal.

## Claims

### Claim 1

A test apparatus for a liquid drop emission apparatus having a plurality of emission mechanisms,
the emission mechanisms each having a driving element configured to emit an ink drop from a nozzle, and an application switch coupled with a driving voltage source and the driving element in series, the application switch being configured to switch a driving voltage for emission of a liquid drop between being applied and not being applied to the driving element,
the test apparatus comprising:
a test switch configured to make each of the emission mechanisms output a test voltage which appears between both ends of the application switch to a test terminal; and
a failure deciding section configured to decide whether the emission mechanism is in failure or not on the basis of the test voltage outputted to the test terminal.

### Claim 2 (depends on 1)

The test apparatus according to claim 1 further comprising a shift register configured to shift nozzle selection data formed by emission feasibility data serially combined in order of the plural emission mechanisms, the emission feasibility data specifying whether a liquid drop is to be emitted or not by each of the plural emission mechanisms, the shift register being configured to output a control signal based on the emission feasibility data from a data output terminal to the application switch of each of the emission mechanisms, wherein
the application switch and the test switch are controlled by the control signal outputted from the same data output terminal of the shift register in each of the emission mechanisms.

### Claim 3 (depends on 2)

The test apparatus according to claim 2, wherein the failure deciding section and the test switch are included with the application switch and the shift register together in a single semiconductor integrated circuit.

### Claim 4 (depends on 1)

The test apparatus according to claim 1, wherein in each of the plural emission mechanisms:
the one end of the application switch is given a known voltage and the other end of the application switch is coupled with the driving element; and
the test switch switches the other end of the application switch between being coupled and decoupled with the test terminal.

### Claim 5 (depends on 4)

The test apparatus according to claim 4, wherein the one end of the application switch is grounded in each of the plural emission mechanisms.

### Claim 6 (depends on 4)

The test apparatus according to claim 4, wherein the one end of the application switch is coupled with the driving voltage source which generates the driving voltage of a known voltage pattern in each of the plural emission mechanisms.