# US 8,740,209 B2 · Method and apparatus for ex-situ lift-out specimen preparation > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 8,740,209 B2 - Document ID: US8740209B2 - Status: Granted - Kind: B2 - Application number: 13/402,708 - Filed: 2012-02-22 - Published: 2013-08-22 - Granted: 2014-06-03 - Earliest claimed: 2012-02-22 - Assignees: EXpressLO LLC - Applicants: Lucille A. Giannuzzi - Inventors: Lucille A. Giannuzzi - Web page: https://patentgrep.com/patent/US8740209B2 ## CPC - H01J 37/3002: {Details} - G01N 1/00: Sampling; Preparing specimens for investigation - G01N 1/32: Polishing; Etching - H01J 37/20: Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support - H01J 2237/201: for mounting multiple objects - H01J 2237/31745: for preparing specimen to be viewed in microscopes or analyzed in microanalysers - Y10T 29/49998: Work holding - Y10T 156/10: Methods of surface bonding and/or assembly therefor - H01J: ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS (spark-gaps H01T; electric arc lamps H05B31/00; particle accelerators H05H) - G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q) - Y10T: TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION ## Abstract A specimen carrier for use with an ex-situ lift-out (EXLO) milling process includes a carrier top surface having at least one specimen support area and at least one aperture formed through the specimen carrier top surface. The aperture includes a first opening having an open wider upper end and a narrower lower end. The first opening is bounded by opposed sidewalls in spaced-apart orientation that are inwardly inclined from the wider upper end to the narrower lower end. The aperture is configured to enable a specimen to sit over the opening and can be wedged between the first opening opposed sidewalls so that a region of interest to be milled is centered about the open end of the opening. Specimens so mounted can then be re-thinned via charged particle instruments such as focused ion beam (FIB) milling, broad beam ion milling, or via laser ablation. ## Claims ### Claim 1 A specimen carrier for use with an ex-situ lift-out (EXLO) milling process, the carrier comprising: a carrier top surface having at least one specimen support area; an aperture formed through the specimen carrier top surface within the specimen support area and having a wider upper end and a narrower lower end, said aperture having a first opening adjacent to the top surface and a recessed opening aligned with said first opening; said first opening bounded by opposed sidewalls in spaced-apart orientation that are inwardly inclined from the wider upper end to the narrower lower end; said recessed opening bounded by opposed sidewalls in spaced-apart orientation narrower than the opposed sidewalls of the first opening to thereby define a resting surface between the sidewalls of the first opening and the sidewalls of the recessed opening, the specimen carrier being configured to enable a specimen to sit over the recessed opening on the resting surface and below the carrier top surface and wedged between the first opening opposed sidewalls so that a region of interest to be milled is centered about the recessed opening. ### Claim 2 (depends on 1) The specimen carrier of claim 1, further including a contiguous portion of the resting surface defined above the upper end of the first opening and within the same plane as the resting surface. ### Claim 3 (depends on 1) The specimen carrier of claim 1, further including a second aperture formed through the specimen carrier top surface in a second specimen support area spaced from said one specimen support area and configured identically to said first aperture. ### Claim 4 (depends on 1) The specimen carrier of claim 1, wherein a width at an upper end of the recessed opening is between about 5 and 100 micrometers. ### Claim 5 (depends on 1) The specimen carrier of claim 1, wherein a length of the recessed opening is between about 50 and 200 micrometers. ### Claim 6 (depends on 1) The specimen carrier of claim 1, wherein a thickness of each the opposed sidewalls of the first opening is between about 5 and 50 micrometers. ### Claim 7 (depends on 2) The specimen carrier of claim 2, wherein the upper end of the first opening and upper end of the recessed opening are spaced between about 5 and 50 micrometers from an upper edge of the specimen carrier. ### Claim 8 (depends on 1) The specimen carrier of claim 1, said carrier including a facing surface configured in facing orientation to an inspection or milling tool, wherein said aperture upper end extends to the facing surface so that a surface to be inspected or milled of the specimen mounted in the specimen support area is exposed to the inspection or milling tool. ### Claim 9 (depends on 8) The specimen carrier of claim 8, further including wing portions framing each side of the specimen support area and extending above the facing surface. ### Claim 10 A specimen carrier for use with an ex-situ lift-out (EXLO) milling process, the carrier comprising: a carrier body having a facing surface and opposed front and back sides, the carrier having at least one specimen mounting area defined along the facing surface; wing portions framing each side of the specimen mounting area and extending above the facing surface; and an aperture formed completely through the carrier body between opposed front and back sides and bounded by opposing aperture sidewalls, said sidewalls defining an open upper end along the facing surface of the carrier body tapering to a narrow lower end, the specimen carrier being configured to enable a specimen to sit over or within the aperture between the opposed sidewalls so that a region of interest to be milled is centered about the aperture. ### Claim 11 (depends on 10) The specimen carrier of claim 10, wherein the facing surface is planar with respect to an inspection tool, whereby the specimen carrier can be rotated such that an upper surface of the specimen extending above the facing surface can be inspected over 360 degrees without interference from obstructing structures on the specimen carrier. ### Claim 12 (depends on 10) The specimen carrier of claim 10, further including a plurality of apertures through the carrier body, each of the plurality of apertures being configured to receive a specimen.