Categorization of design rule errors
AssigneeInternational Business Machines Corporation
InventorsRichard S. Brink, Michael R. Curry, Jay A. Lawrence, Thomas C. Perez, Scott Trcka, John W. Zack
Life of this patent
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Abstract
Embodiments of the invention include a method for categorizing and displaying design rule errors. The method may include receiving, from a design rule checker, more than one violation of a design rule within a design layout. The method may also include determining distinct categories of the design rule violations by comparing parameters associated with the design rule violations.
Claims16
A computer implemented method comprising:
- receiving, from a design rule checker, more than one violation of a design rule within a design layout;
- determining dynamically, by using a computer, distinct categories of the design rule violations by comparing one or more parameters associated with the design rule violations, wherein the parameters include a first identification parameter associated with a cell associated with the design rule violation, a second identification parameter including at least that the cell associated with the design rule violation is an instance of a particular parent cell, and
- a third identification parameter including at least a specification of one or more adjacent neighbor cells, wherein the specified adjacent neighbor cell includes a violating shape;
- and comparing elements within a window surrounding each design rule violation.
A computer implemented method for categorizing violations of a design rule, comprising:
- receiving, from a design rule checker, two or more of violations of a design rule within an integrated circuit (IC) layout, each violation having an error marker and the IC layout having two or more cells;
- determining dynamically, by using a computer, a local region for each of the violations wherein the local region is in a first cell, the violation is associated with a particular cell adjacent to the first cell, and parameters associated with the local region include an identification parameter of the adjacent cell, wherein the adjacent cell includes a violating shape;
- and
- for each of the violations:
- determining one or more parameters associated with the local region, wherein the parameters include the identification parameter associated with a cell associated with the design rule violation, the identification parameter including at least that the cell associated with the design rule violation is an instance of a particular parent cell, wherein the parameters associated with the local region includes a dimension of the error marker and includes a distance from the error marker to the violating shape, and
- classifying the violation as being in a particular error category when the associated parameters are substantially similar to corresponding parameters for the error category.
A non-transitory computer readable storage medium having instructions stored thereon which, when executed, cause a processor to perform the following operations:
- receiving, from a design rule checker, two or more of violations of a design rule within an integrated circuit (IC) layout, each violation having an error marker and the IC layout having two or more cells;
- determining dynamically a local region for each of the violations wherein the local region is in a first cell, the violation is associated with a particular cell adjacent to the first cell, and the parameters associated with the local region include an identification parameter of the adjacent cell, wherein the adjacent cell includes the violation;
- and
- for each of the violations:
- determining one or more parameters associated with the local region, wherein the parameters include the identification parameter associated with a cell associated with the design rule violation, the identification parameter including at least that the cell associated with the design rule violation is an instance of a particular parent cell, and
- dynamically classifying the violation as being in a particular error category when the associated parameters are substantially similar to corresponding parameters for the error category.
Dependencies are inferred from the claim text.