Circuitry testing module and circuitry testing device
AssigneesHONG FU JIN PRECISION INDUSTRY (ShenZhen) CO., LTD., Hon Hai Precision Industry Co., Ltd.
InventorsXiong-Zhi Chen, Sung-Kuo Ku
Life of this patent
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Abstract
A circuitry testing module for testing an external circuit of a Light-Emitting Diode (LED) includes at least one logic unit and a latch circuit. Two input terminals of the at least one logic unit are connected to a first end and a second of the LED correspondingly. The output terminal of the at least one logic unit is connected to the latch circuit. If the external circuit works normally, the logic unit outputs a first logic operating signal to the latch unit, and the latch circuit outputs a first latch signal. If the external circuit does not work normally, the logic unit outputs a second logic operating signal to the latch unit, and the latch circuit outputs a second latch signal.
Claims10
A circuitry testing module for testing an external circuit of a light emitting diode (LED), the LED comprising a first end and a second end, the circuitry testing module comprising:
- at least one logic unit having two input terminals connecting to the first end and the second end of the LED correspondingly;
- and
- a latch circuit connected to an output terminal of the at least one logic unit;
- wherein in response to normal operation of the external circuit determined by the at least one logic unit, the latch circuit outputs a first latch signal;
- and in response to abnormal operation of the external circuit determined by the at least one logic unit, the latch circuit outputs a second latch signal;
- wherein the latch circuit comprises a microchip, the microchip comprises a power supply contact connected to a power supply, a clock contact, a data contact and an output contact;
- the clock contact and the data contact are connected to the output terminal of the logic unit and grounded by a first resistor;
- when the at least one logic unit determines the external circuit works normally, the logic unit outputs a first logic operating signal to the clock contact, the clock contact triggers the data contact to receive the first logic operating signal, the output contact outputs the first latch signal;
- otherwise when the at least one logic unit determines the external circuit works abnormally, the data contact does not receive the first logic operating signal output from the logic unit, the output contact outputs the second latch signal.
A circuitry testing device for testing an external circuit of multiple light emitting diodes (LEDs), each LED comprising a first end and a second end , the circuitry testing device comprising:
- a connecting circuit;
- a plurality of logic units, each of the logic units having two input terminals connecting to the first end and the second end of one of the LEDs correspondingly through the connecting circuit;
- a logic operating circuit connected to the logic units;
- and
- a latch circuit, the latch circuit connected to an output terminal of the logic operating circuit, each of the logic units performing a logic OR operation;
- wherein in response to normal operation of the external circuit determined by at least one of the logic units, the latch circuit outputs a first latch signal;
- and in response to abnormal operation of the external circuit determined by at least one of the logic units, the latch circuit outputs a second latch signal;
- wherein the latch circuit comprises a microchip, the microchip comprises a power supply contact connected to a power supply, a clock contact, a data contact and an output contact, the clock contact and the data contact are connected to the output terminal of the logic operating circuit and grounded by a first resistor;
- when the at least one of the logic units determine the external circuit works normally, the logic operating circuit outputs a first logic operating signal to the clock, the clock contact triggers the data contact to receive the first logic operating signal, the output contact outputs the first latch signal;
- otherwise when the at least one of the logic units determine the external circuit works abnormally, the data contact does not receive the first logic operating signal output from logic operating circuit, the output contact outputs the second latch signal.
Dependencies are inferred from the claim text.