Tap and linking module TDO register, gating for TCK and TMS
AssigneeTexas Instruments Incorporated
InventorsBaher S. Haroun, Lee D. Whetsel
Life of this patent
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Abstract
An architecture for testing a plurality of circuits on an integrated circuit is described. The architecture includes a TAP Linking Module located between test pins on the integrated circuit and 1149.1 Test Access Ports (TAP) of the plurality of circuits to be tested. The TAP Linking Module operates in response to 1149.1 scan operations from a tester connected to the test pins to selectively switch between 1149.1 TAPs to enable test access between the tester and plurality of circuits. The TAP Linking Module's 1149.1 TAP switching operation is based upon augmenting 1149.1 instruction patterns to affix an additional bit or bits of information which is used by the TAP Linking Module for performing the TAP switching operation.
Claims5
An integrated circuit comprising:
- A. a TDI input lead, a TCK input lead, a TMS input lead, and a TDO output lead;
- B. a TDI1 output lead, a TCK1 output lead, a TMS1 output lead, and a TDO1 input lead;
- C. TAP linking module circuitry including:
- i. a register coupled between the TDO input lead and the TDO output lead and having an Enable1 output;
- and
- ii. gating circuitry having inputs coupled to the TCK input lead and the TMS input lead, enable1 inputs coupled to the Enable1 output, and outputs coupled to the TCK1 output lead and the TMS1 output lead.
Dependencies are inferred from the claim text.