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AssigneeQUALCOMM Incorporated
InventorsWei Chen, Yucong Tao, Matthew L. Severson, Jeffrey R. Gemar, Chang Yong Yang
Estimating the term…
In examples, apparatus and methods are provided for an integrated circuit. The integrated circuit includes a first integrated circuit portion having a main power domain and a second integrated circuit portion having a collapsible power domain. The integrated circuit also has a level shifter having an input coupled to the second circuit portion and an output coupled to the first integrated circuit portion. The level shifter is configured to hold constant the level shifter output when power to the collapsible power domain is collapsed. A quiescent drain current measurement circuit can be coupled to test at least a part of the second integrated circuit portion. A boundary scan register can be coupled between the level shifter output and the first integrated circuit portion. The integrated circuit can also include a power management circuit.
An integrated circuit, comprising:
A non-transitory computer-readable medium, comprising instructions stored thereon that, if executed by a lithographic device, cause the lithographic device to fabricate at least a part of a device, comprising:
A method for testing an integrated circuit having a first integrated circuit portion with a main power domain, a second integrated circuit portion having a collapsible power domain, and a level shifter having an input coupled to the second circuit portion and an output coupled to the first integrated circuit portion, comprising:
An integrated circuit, comprising:
Dependencies are inferred from the claim text.