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US 8,713,387 B2Granted
Channel marking for chip mark overflow and calibration errors
AssigneeInternational Business Machines Corporation
InventorsJudy S. Johnson, Luis A. Lastras-Montano, Patrick J. Meaney, Eldee Stephens
Life of this patent
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Abstract
Marking memory chips as faulty when a fault is detected in data from the memory chip. Upon detecting that a plurality of memory chips are faulty, determining which of a plurality of memory channels contains the faulty memory chips. Marking one of a plurality of memory channels as failing in response to determining that the number of failing memory chips has exceeded a threshold.
Claims11
A computer implemented method comprising:
- detecting whether a chip error has occurred in one of a plurality of memory chips in a first memory channel of a plurality of memory channels, the detecting spanning across at least one rank of the plurality of memory channels, and generating chip mark data based on the chip error occurring;
- receiving, by a marking module, the chip mark data;
- determining whether a number of chip errors in the at least one rank exceeds a chip mark threshold based on the chip mark data and a mark table of the marking module, wherein the chip mark threshold comprises a number of available chip marks in the mark table;
- based on determining that the number of chip errors in the at least one rank exceeds the chip mark threshold, determining whether one of the plurality of memory channels comprises a marked channel;
- based on determining that none of the plurality of memory channels comprises a marked channel, determining, based on the mark table, whether there are multiple chip marks in any channel of the plurality of memory channels;
- and
- based on determining that there are not multiple chip marks in any channel of the plurality of memory channels, marking the first channel as a marked channel.
4 more elements
Dependencies are inferred from the claim text.