X-ray imaging
AssigneeIllinois Tool Works Inc.
InventorsChristopher James Kaine, Alain Stephen Dekker
Life of this patent
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AssigneeIllinois Tool Works Inc.
InventorsChristopher James Kaine, Alain Stephen Dekker
Estimating the term…
An X-ray scanning apparatus for locating a contaminant in a product, the apparatus comprising: means for generating an X-ray image of the product; means for assigning a grey scale value to a plurality of pixels; means for identifying a plurality of suspect pixels; means, which for each suspect pixel: selects two neighboring pixels in a first direction lying on opposed sides of the suspect pixel and determines which of the first direction pixels has the lowest grey value; selects two neighboring pixels in a second direction lying on opposed sides of the suspect pixel and determines which of the second direction pixels has the lowest grey value; determines a first direction difference value by taking the grey value difference between the lowest grey value first direction pixel and the grey value of the suspect; determines a second direction difference value by taking the grey value difference between the lowest grey value second direction pixel and the grey value of the suspect; determines a first direction score from the first direction difference value; determines a second direction score from the second direction difference value; compares said scores with a threshold value; and identifies the suspect pixel as representing a contaminant if said threshold value is exceeded.
An X-ray scanning apparatus for locating a contaminant in a product, the apparatus comprising:
The apparatus as claimed in any preceding claim, comprising means for setting a distance between each of the neighbouring pixels and the suspect pixel, in dependence on a user defined maximum contaminant size.
An X-ray scanning method for locating a contaminant in a product, the method comprising the steps of:
Dependencies are inferred from the claim text.