Memory device, test operation method thereof, and system including the same

A test operation method of a memory device, the test operation method comprising:

• generating, by a reference current generator, a reference current and providing a reference voltage generated based on the reference current to a first input terminal of a sense amplifier;
• providing a read voltage generated based on a read current of a memory cell to a second input terminal of the sense amplifier;
• and
• comparing, by the sense amplifier, the reference voltage with the read voltage, wherein the method further comprises:
• changing a level of the reference current and generating a distribution graph of a plurality of memory cells with respect to the levels of the reference current;
• comparing the distribution graph of the memory cells with respect to the levels of the reference current with a memory cell distribution graph produced using a test element group (TEG);
• and
• compensating for an offset of the distribution graph of the memory cells with respect to the level of the reference current.

A memory system, comprising:

• a memory device;
• and
• a processor configured to control the memory device,
• wherein the memory device includes:
• a memory cell connected to a word line and a plurality of bit lines;
• a reference current generator configured to generate a reference current;
• and
• a sense amplifier configured to perform a test operation by comparing a read voltage generated based on a read current of the memory cell with a reference voltage generated based on the reference current, and wherein, when the read current is less than the reference current, the sense amplifier counts the memory cell.

A memory system, comprising:

• a memory device;
• and
• a processor configured to control the memory device,
• wherein the memory device includes:
• a memory cell connected to a word line and a plurality of bit lines;
• a reference current generator configured to generate a reference current;
• and
• a sense amplifier configured to perform a test operation by comparing a read voltage generated based on a read current of the memory cell with a reference voltage generated based on the reference current, and wherein the reference current generator comprises:
• a reference voltage pin configured to receive a reference pin voltage and change a level of the reference current;
• and
• a reference current pin connected to a test probe to monitor the level of the reference current.

A memory device, comprising:

• a plurality of memory cells;
• a sense amplifier;
• a reference current generator including a plurality of transistors coupled in series between a reference current pin and a ground supply;
• and
• a bit line load circuit configured to function as an active resistor to generate the read voltage, wherein:
• at least one of the transistors is controlled by a reference voltage pin,
• the reference current generator is configured to generate a reference current, and to provide a reference voltage generated based on the reference current to the sense amplifier,
• wherein the sense amplifier is configured to compare the reference voltage with a read voltage generated based on a read current of a respective one of the memory cells, and
• wherein the bit line load circuit includes a plurality of transistors and each of the plurality of memory cells includes a plurality of transistors and corresponding ones of the plurality of transistors of the memory cells and the bit line load circuit are coupled in series between a supply voltage and a ground supply, and electrical characteristics of the plurality of the corresponding ones of the transistors of the memory cells and the bit line load circuit that are coupled in series are same as electrical characteristics of the plurality of transistors of the reference current generator coupled in series.