Programming method of non-volatile memory device
AssigneeHynix Semiconductor Inc.
InventorsSeiichi Aritome, Hyun-Seung Yoo, Sung-Jin Whang
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AssigneeHynix Semiconductor Inc.
InventorsSeiichi Aritome, Hyun-Seung Yoo, Sung-Jin Whang
Estimating the term…
A programming method of a non-volatile memory device that includes a string of memory cells with a plurality of floating gates and a plurality of control gates disposed alternately, wherein each of the memory cells includes one floating gate and two control gates disposed adjacent to the floating gate and two neighboring memory cells share one control gate. The programming method includes applying a first program voltage to a first control gate of a selected memory cell and a second program voltage that is higher than the first program voltage to a second control gate of the selected memory cell, and applying a first pass voltage to a third control gate disposed adjacent to the first control gate and a second pass voltage that is lower than the first pass voltage to a fourth control gate disposed adjacent to the second control gate.
A programming method of a non-volatile memory device that includes a string of memory cells with a plurality of floating gates and a plurality of control gates disposed alternately, wherein each of the memory cells includes one floating gate and two control gates disposed adjacent to the floating gate and two neighboring memory cells share one control gate, the programming method comprising:
A programming method of a non-volatile memory device that includes a plurality of floating gates and a plurality of control gates disposed alternately between a bit line and a source line, the programming method comprising:
Dependencies are inferred from the claim text.