Optical imaging device and imaging method for microscopy
AssigneeCarl Zeiss SMT GmbH
InventorsHans-Juergen Mann, Heiko Feldmann
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AssigneeCarl Zeiss SMT GmbH
InventorsHans-Juergen Mann, Heiko Feldmann
Estimating the term…
The present invention relates to an optical imaging device, in particular for microscopy, with a first optical element group and a second optical element group, wherein the first optical element group and the second optical element group, on an image plane, form an image of an object point of an object plane via at least one imaging ray having an imaging ray path. The first optical element group comprises a first optical element with a reflective first optical surface in the imaging ray path and a second optical element with a reflective second optical surface in the imaging ray path, wherein the first optical surface is concave. The second optical element group comprises a third optical element with a concave reflective third optical surface in the imaging ray path and a fourth optical element with a convex reflective fourth optical surface in the imaging ray path without light passage aperture.
An optical imaging device comprising:
A microscope, comprising:
A method, comprising:
An optical imaging device comprising:
An optical imaging device comprising:
A method, comprising:
Dependencies are inferred from the claim text.
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Using three curved mirrors: on-axis systems with at least one of the mirrors having a central aperture
Objectives: involving mirrors
Optical elements, systems or apparatus
About 4 years 8 months of term left · ends 20 Jun 2031 (estimated)
The present invention relates to optical imaging devices and imaging methods for microscopy. The invention can be applied in connection with the inspection of arbitrary surfaces or bodies.
In many technical areas, it is necessary, among others, to subject bodies and their surfaces to a precise optical inspection in order to be able, for example, to assess the quality of a production process and, where applicable, intervene correctively insofar as the inspection reveals that specified quality criteria are not fulfilled. Naturally, the same if not higher requirements must be imposed on the precision of the imaging device used for the inspection in comparison with the devices used for the production process of the body to be inspected.
In this context, the ability of the imaging device used for the inspection to process light of different wavelengths with minimum optical aberration is of particular importance in order to ensure a broad application field for the imaging device. In particular, in connection with the production methods which comprise an optical process, it is desirable or advantageous if the imaging device used can process the wavelength range also used during the optical process with minimum aberrations. This is, for example, the wavelength range of 193 nm (so called VUV range) to 436 nm (so called Hg g line).
FIG. 1 is a schematic representation of a preferred embodiment of a microscope according to the invention with a preferred embodiment of the optical imaging device according to the invention, with which a preferred embodiment of an imaging method according to the invention can be performed;
FIG. 2 is a schematic representation of the optical imaging device of FIG. 1;
FIG. 3 is a block diagram of a preferred embodiment of the imaging method according to the invention which can be performed with the microscope of FIG. 1;
With reference to FIGS. 1 to 3, a preferred embodiment of the microscope 101 according to the invention comprising a preferred embodiment of the optical imaging device 102 according to the invention is described below.
In the present example, the microscope 101 is used to inspect the structures formed on a substrate 103.1 (which were produced, for example, via an optical process). However, with other variants of the invention, the microscope according to the invention can also be used for an imaging process in connection with arbitrary applications, in particular, with the inspection of arbitrary other bodies, substrates, surfaces or fluids etc.
FIG. 1 shows a schematic representation of the microscope 101 which comprises an optical imaging device in the form of an objective 102 (with an optical axis 102.1 and an illumination system 102.2), a substrate device 103 and an image recording device 104. The illumination system 102.2 illuminates (via a light guide device not shown in greater detail) the substrate 103.1 which is arranged on a substrate table 103.2 of the substrate device 103, with an imaging light beam 105 (only depicted partially, among others, through its envelope rays) which comprises a plurality of imaging rays 105.1.