Spectral measurement device
AssigneeSeiko Epson Corporation
InventorTatsuaki Funamoto
Life of this patent
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Abstract
A spectral measurement device includes: an optical band-pass filter section that has first to n-th wavelengths (n is an integer of 2 or more) having a predetermined wavelength width as a spectral band thereof; a correction operation section that corrects a reception signal based on an output optical signal from the optical band-pass filter section; and a signal processing section that executes predetermined signal processing based on the reception signal corrected by the correction operation section that corrects the reception signal based on the change in the spectral distribution of the reception signal.
Claims6
A method for measuring a spectral distribution using a spectral measurement device having an optical band-pass filter section, a light receiving section receiving light from the optical band-pass filter section and a correction operation section performing an operation to correct a reception signal obtained from the light receiving section, the method comprising the steps of:
- (a) receiving light of first to n-th wavelengths, wherein n is an integer of 3 or more, by the light receiving section;
- (b) calculating a second derivative of a characteristic line representing the spectral distribution of the reception signals of the light of first to n-th wavelengths by the correction operation section;
- and
- (c) decreasing the reception signal when the second derivative is positive and increasing the reception signal when the second derivative is negative by the correction operation section.
Dependencies are inferred from the claim text.