Solid-state imaging device

A solid-state imaging device comprising:

• an imaging element formed on a semiconductor substrate, and comprising an imaging area including a plurality of pixel blocks each including a plurality of pixels;
• a first optical system configured to focus an image of a subject on an imaging plane;
• a second optical system comprising a microlens array including a plurality of microlenses corresponding to the pixel blocks, and re-focusing the image of the imaging plane onto the pixel blocks corresponding to the respective microlenses;
• a first filter placed on the second optical system, and including a plurality of first color filters corresponding to the microlenses;
• and
• a second filter placed on the imaging element, and including a plurality of second color filters corresponding to the first color filters of the first filter,
• wherein, the first and second filters are designed so that the first and second color filters deviate to a periphery of the imaging area, the deviation becoming larger toward the periphery of the imaging area, wherein another microlens array including other microlenses corresponding to the respective pixels is provided on the opposite side of the second filter from the imaging element.

A solid-state imaging device comprising:

• an imaging element formed on a semiconductor substrate, and comprising an imaging area including a plurality of pixel blocks each including a plurality of pixels;
• a first optical system configured to focus an image of a subject on an imaging plane;
• a second optical system comprising a microlens array including a plurality of microlenses corresponding to the pixel blocks, and re-focusing the image of the imaging plane onto the pixel blocks corresponding to the respective microlenses;
• a first filter placed on the second optical system, and including a plurality of first color filters corresponding to the microlenses;
• and
• a second filter placed on the imaging element, and including a plurality of second color filters corresponding to the first color filters of the first filter, wherein, the first and second filters are designed so that the first and second color filters deviate to a periphery of the imaging area, the deviation becoming larger toward the periphery of the imaging area, and wherein the first and second color filters each include red, green, and blue color filters, and wherein each of the first and second filters is in a Bayer arrangement, and a distance to the subject is determined by performing image matching between two green pixel blocks existing in each one unit of the Bayer arrangement.

A solid-state imaging device comprising:

• an imaging element formed on a semiconductor substrate, and comprising an imaging area including a plurality of pixel blocks each including a plurality of pixels;
• a first optical system configured to focus an image of a subject on an imaging plane;
• a second optical system comprising a microlens array including a plurality of microlenses corresponding to the pixel blocks, and re-focusing the image of the imaging plane onto the pixel blocks corresponding to the respective microlenses;
• a first filter placed on the second optical system, and including a plurality of first color filters corresponding to the microlenses;
• a second filter placed on the imaging element, and including a plurality of second color filters corresponding to the first color filters of the first filter;
• and
• a processing unit configured to perform image matching between two pixel blocks having the same color to determine a distance to the subject, wherein, the first and second filters are designed so that the first and second color filters deviate to a periphery of the imaging area, the deviation becoming larger toward the periphery of the imaging area.