Back to results
US 8,710,546 B2Granted
Avalanche photodiodes having accurate and reproductible amplification layer
AssigneeElectronics and Telecommunications Research Institute
InventorsMi-Ran Park, O-Kyun Kwon
Life of this patent
Estimating the term…
Abstract
Provided are an avalanche photodiode and a method of fabricating the same. The method of fabricating the avalanche photodiode includes sequentially forming a compound semiconductor absorption layer, a compound semiconductor grading layer, a charge sheet layer, a compound semiconductor amplification layer, a selective wet etch layer, and a p-type conductive layer on an n-type substrate through a metal organic chemical vapor deposition process.
Claims13
An avalanche photodiode comprising:
- a compound semiconductor absorption layer on an n-type substrate;
- a compound semiconductor grading layer on the compound semiconductor absorption layer;
- a charge sheet layer on the compound semiconductor grading layer;
- a compound semiconductor amplification layer on the charge sheet layer;
- a selective wet etch layer aperture pattern on the compound semiconductor amplification layer;
- a dielectric layer on the compound semiconductor amplification layer;
- and
- a p-type conductive mesa pattern on the selective wet etch layer aperture pattern,
- wherein:
- the aperture pattern has a side wall which comes in contact with the dielectric layer;
- and
- the aperture pattern has an upper surface that faces the p-type conductive mesa pattern, and the entire upper surface of the aperture pattern is covered by the p-type conductive mesa pattern.
9 more elements
Dependencies are inferred from the claim text.