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US 8,710,430 B2Granted
Mass spectrometry method
AssigneeHitachi High-Technologies Corporation
InventorsMasuyuki Sugiyama, Yuichiro Hashimoto, Shun Kumano, Yohei Kawaguchi, Hidetoshi Morokuma
Life of this patent
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Abstract
A mass spectrometry method that corrects the effects from space charge and that achieves both sensitivity and a dynamic range. The mass axis of the mass spectrum is corrected based on the counts of ions accumulated within the ion trap at the point in time each ion was extracted.
Claims8
A mass spectrometry method comprising:
- ionizing a sample with an ion source;
- accumulating the ions in an ion trap;
- and
- acquiring the mass spectrum by ejecting ions selectively by mass from the ion trap and detecting the ions by a detector,
- wherein the mass axis of the mass spectrum is corrected based on the counts of ions accumulated within the ion trap at the point in time that each ion was extracted.
2 more elements
Dependencies are inferred from the claim text.