Methods and systems for analyzing samples
AssigneeMaterialytics, LLC
InventorsCatherine E. McManus, James W. Dowe, III, Tristan M. Likes, James W. Dowe, IV
Life of this patent
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AssigneeMaterialytics, LLC
InventorsCatherine E. McManus, James W. Dowe, III, Tristan M. Likes, James W. Dowe, IV
Estimating the term…
This disclosure relates to a method for analyzing a sample of material. The method includes (a) converting a portion of the sample into a plasma multiple times; (b) recording a spectrum of electromagnetic radiation emitted in response to each of the sample conversions to define a sequence of spectra for the sample, in which each member of the sequence corresponds to the spectrum recorded in response to a different one of the sample conversions; (c) using an electronic processor to compare the sequence of spectra for the sample to a sequence of spectra for each of at least one reference sample in a reference library; and (d) using the electronic processor to determine information about the sample based on the comparison to the reference samples in the library.
A method for analyzing a sample, the method comprising:
A system for analyzing a sample, the system comprising:
A method for analyzing a sample, the method comprising:
A system for analyzing a sample, the system comprising:
Dependencies are inferred from the claim text.