Semiconductor device, write strategy generating method, and write strategy generating program

A write strategy generating method comprising the steps of:

• receiving evaluation information for evaluating recording quality related to writing into an optical disk to generate a write strategy, wherein the evaluation information includes error information generated according to a reproduction signal read from the optical disk and corresponds to a shift in a phase of the reproduction signal with respect to a channel clock signal for data reproduction;
• selecting a first write strategy at which a value of the error information included in the evaluation information and related to each of a plurality of test recording marks recorded in accordance with a plurality of recording strategies, becomes minimum as a whole;
• and
• generating a second write strategy by adjusting a parameter of the first write strategy in such a manner that a value of the error information included in the evaluation information and related to a desired recording mark, is reduced.

A memory having stored therein a write strategy generating program for generating a new write strategy, based on evaluation information for evaluating recording quality, generated according to a reproduction signal read from an optical disk,

• wherein the evaluation information includes error information corresponding to a shift in a phase of the reproduction signal with respect to a channel clock signal for data reproduction, and
• wherein the write strategy generating program includes:
• a first program code for adjusting first parameters defining a laser pulse waveform for writing in a write strategy, in such a manner that a value of the error information related to a plurality of test recording marks becomes minimum as a whole, and
• a second program code for adjusting a second parameter in such a manner that a value of the error information related to a desired recording mark is reduced, the desired recording mark being a recording mark for which a value of the error information is greater than or equal to a predetermined threshold value of the plurality of test recording marks.