Arrangement of analyzer measuring window
AssigneeOutotec Oyj
InventorsKari Mann, Christian Von Alfthan
Life of this patent
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Abstract
The invention relates to an arrangement of a measuring window in a continuously operated X-ray analyzer (1), said analyzer being is used particularly for analyzing elemental contents in solid, liquid or slurry-like materials; which measuring window (2) separates the sampling space (3) containing the sample material to be measured and the measurement space (4) containing the measuring probe (11), and is sealed by a lid structure (6) arranged in the sampling space, said lid structure defining the measurement aperture (7) of the sampling space, in which case the lid structure defining the measurement aperture of the sampling space is provided with a sealing surface (8) of the measuring window, so that said surface is at least partly planar and at least partly curved.
Claims8
An arrangement of a measuring window in a continuously operated X-ray analyzer (1), said analyzer being used particularly when analyzing elemental contents in solid, liquid or slurry-like materials, which measuring window (2) separates a sampling space (3) containing a sample material to be measured and a measurement space (4) containing a measuring probe (11), and is sealed onto a lid structure (6) arranged in the sampling space, said lid structure (6) defining a measurement aperture (7) of the sampling space, characterized in that the lid structure (6), made of ceramic material, defining the measurement aperture (7) of the sampling space, is provided with a sealing surface (8) of the measuring window, said sealing surface (8) surrounding the measurement aperture (7) and being at least partly planar and having a curved section, the sealing surface (8) being elevated with respect to a surface of the lid structure (6) surrounding the sealing surface (8).
Dependencies are inferred from the claim text.