Controller to detect malfunctioning address of memory device

A device, comprising:

• a memory device;
• and
• a controller operatively coupled with the memory device, the controller comprising:
• a non-volatile memory to store a repair address;
• and
• a memory control unit operatively coupled with the non-volatile memory, the memory control unit comprising a memory test function configured to detect a malfunctioning address of primary data storage elements within a memory device, the memory device being another semiconductor device separate from the controller, the memory test function configured to store the repair address in the non-volatile memory, the repair address indicating the malfunctioning address of the primary data storage element wherein the memory control unit further comprises a memory setup function.

A method, comprising:

• detecting a malfunctioning address of primary data storage elements within a memory device;
• storing a repair address corresponding to the malfunctioning primary data storage elements in a non-volatile memory of a controller, the memory device being another semiconductor device separate from the controller;
• and
• enabling a memory setup function in the controller to program a memory repair circuit in the memory device based on the stored repair address in preparation for memory access operations.