Device, system, and method for reflecting ions
AssigneeAgilent Technologies, Inc.
InventorGangqiang Li
Life of this patent
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Abstract
Devices and systems for reflecting ions are provided. In general, the devices and systems include a plurality of curved lens plates adapted for connection to at least one voltage source and having a passage therein to allow the ions to pass therethrough. The plurality of curved lens plates generates electric fields having elliptic equipotential surfaces that reflect and focus the ions as they pass through the passage. Reflectron time-of-flight (RE-TOF) spectrometers are also provided that include an ion source, ion detector, and such a reflectron as described above. Mass spectrometer systems are provided that comprise an ion source that generates ions and a reflectron TOF spectrometer such as described above.
Claims20
A reflectron for reflecting ions in a time-of-flight mass spectrometer, comprising:
- a plurality of curved lens plates adapted for connection to at least one voltage source and having a passage therein to allow the ions to pass therethrough;
- wherein the plurality of curved lens plates generate electric fields having elliptic equipotential surfaces that reflect and focus the ions as they pass through the passage.
A reflectron time-of-flight (TOF) spectrometer, comprising:
- a transmission electrode that transmits ions in a first direction;
- a first reflectron that reflects ions transmitted from the transmission electrode, the first reflectron comprising:
- a first plurality of curved lens plates adapted for connection to a voltage source and having a first passage therein to allow the ions to pass therethrough;
- wherein the first plurality of curved lens plates generate first electric fields having first elliptic equipotential surfaces that reflect and focus the ions as they pass through the opening;
- and
- an ion detector that receives the reflected ions.
Dependencies are inferred from the claim text.