Ultrashort laser pulse wafer scribing
AssigneeElectro Scientific Industries, Inc.
InventorsJeffrey A. Albelo, Peter Pirogovsky
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AssigneeElectro Scientific Industries, Inc.
InventorsJeffrey A. Albelo, Peter Pirogovsky
Estimating the term…
Systems and methods are provided for scribing wafers with short laser pulses so as to reduce the ablation threshold of target material. In a stack of material layers, a minimum laser ablation threshold based on laser pulse width is determined for each of the layers. The highest of the minimum laser ablation thresholds is selected and a beam of one or more laser pulses is generated having a fluence in a range between the selected laser ablation threshold and approximately ten times the selected laser ablation threshold. In one embodiment, a laser pulse width in a range of approximately 0.1 picosecond to approximately 1000 picoseconds is used. In addition, or in other embodiments, a high pulse repetition frequency is selected to increase the scribing speed. In one embodiment, the pulse repetition frequency is in a range between approximately 100 kHz and approximately 100 MHz.
A method of cutting a work piece including a plurality of layers formed over a substrate, each of the plurality of layers having a respective laser ablation threshold that varies with laser pulse width, the method comprising:
A method of scribing a wafer having a plurality of integrated circuits formed thereon or therein, the integrated circuits separated by one or more streets, the method comprising:
A method of scribing a wafer having a plurality of integrated circuits formed thereon or therein, the integrated circuits separated by one or more streets, the method comprising:
A method of scribing a wafer having a plurality of integrated circuits formed thereon or therein, the integrated circuits separated by one or more streets, the method comprising:
Dependencies are inferred from the claim text.