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US 8,621,295 B2Granted
Circuit module, semiconductor integrated circuit, and inspection apparatus and method thereof
AssigneeFujitsu Limited
InventorYutaka Tamiya
Life of this patent
Estimating the term…
Abstract
A circuit module includes a shift register constituting part of a scan chain within a semiconductor integrated circuit, a control unit for controlling an operation of the shift register using a control signal generated within the semiconductor integrated circuit and a selection unit for selecting between a short-circuit path through which a scan signal is loaded and an ordinary path through which the scan signal is loaded after being made to go through the shift register, where the ordinary path is selected when the operation of the shift register is permitted by the control signal and the short-circuit path is selected when the operation of the shift register is not permitted.
Claims9
A circuit module, comprising:
- a plurality of shift registers constituting part of a scan chain within a semiconductor integrated circuit;
- a control signal generation unit configured to generate a clock gating signal for the scan chain, whereby the shift registers are enabled;
- a clock gating circuit configured to supply a clock signal to the shift registers and controlled by the clock gating signal, the clock signal not being supplied to the shift registers when the clock gating signal is not set;
- and
- a selection unit configured to select either a short-circuit path through which a scan signal does not go through the shift registers or an ordinary path through which the scan signal goes through the shift registers, and controlled by the clock gating signal, where the short circuit path is selected when the clock gating signal is not set.
2 more elements
A semiconductor integrated circuit, comprising:
- a plurality of circuit modules including shift registers constituting a scan chain;
- a control signal generation unit configured to generate a clock gating signal for each of the circuit modules, whereby the shift registers are enabled;
- a clock gating circuit configured to supply a clock signal to the shift registers of each of the circuit modules and controlled by the clock gating signal, the clock signal is not supplied to the shift registers of each of the circuit modules when the clock gating signal is not set;
- and
- a selection unit configured to select either a short-circuit path through which a scan signal for each of the circuit modules does not go through the shift registers or an ordinary path through which the scan signal goes through the shift registers, and controlled by the clock gating signal, where the short-circuit path is selected when the clock gating signal is not set.
2 more elements
A system having an inspection apparatus for inspecting a semiconductor integrated circuit, comprising:
- a plurality of circuit modules including shift registers constituting a scan chain;
- a control signal generation unit configured to generate a control signal for each of the circuit modules, whereby the shift registers are enabled;
- and
- a clock gating circuit configured to supply a clock signal to the shift registers of each of the circuit modules and controlled by the clock gating signal, the clock signal is not supplied to the shift registers of each of the circuit modules when the clock gating signal is not set;
- and
- a selection unit configured to select either a short-circuit path through which a scan signal for each of the circuit modules does not go through the shift registers or an ordinary path through which the scan signal goes through the shift registers, and controlled by the clock gating signal, the short-circuit path is selected when the clock gating signal is not set;
- wherein;
- the inspection apparatus including:
- an acquisition unit for acquiring a scan data string output from the semiconductor integrated circuit;
- a storage unit for storing output destination information identifying one of the circuit modules which is an output destination, and output sequence information indicating the output sequence of the shift registers of each of the circuit modules;
- a detection unit for detecting path selection information of one of the circuit modules, whose path selection information indicating which path has been selected is unknown, from a target scan data string, according to output destination information stored by the storage unit;
- a specification unit for specifying circuit modules, among the plurality of circuit modules, in an order of output, according to the output sequence information stored by the storage unit;
- a determination unit for determining which path, between the ordinary path and the short-circuit path, path selection information detected with respect to the circuit modules specified by the specification unit indicates;
- a setting unit for setting as many scan data strings, among scan data strings acquired by the acquisition unit, as a number of data-retaining elements included in the shift registers within the circuit module in the target scan data string, when a determination is made by the determination unit that the ordinary path is indicated;
- an association unit for associating the target scan data string with the identification information of the circuit modules;
- and
- an output unit for outputting a result of association provided by the association unit.
14 more elements
Dependencies are inferred from the claim text.