Identification of integrated circuits
AssigneeEmpire Technology Development LLC
InventorsMiodrag Potkonjak, Farinaz Koushanfar
Life of this patent
Estimating the term…
Loading patent…
AssigneeEmpire Technology Development LLC
InventorsMiodrag Potkonjak, Farinaz Koushanfar
Estimating the term…
Techniques are generally described for generating an identification number for an integrated circuit (IC). In some examples, methods for generating an identification of an IC may comprise selecting circuit elements of the IC, evaluating measurements of an attribute of the IC for the selected circuit elements, wherein individual measurements are associated with corresponding input vectors previously applied to the IC, solving a plurality of equations formulated based at least in part on the measurements taken of the attribute of the IC for the selected circuit elements to determine scaling factors for the selected circuit elements, and transforming the determined scaling factors for the selected circuit elements to generate an identification number of the IC. Additional variants and embodiments may also be disclosed.
A method for identifying integrated circuits, the method comprising:
A computing device effective to identify integrated circuits the computing device comprising:
A combination of an integrated circuit and a computing device, the computing device effective to identify integrated circuits, the combination comprising:
An apparatus arranged to determine an identification number of an integrated circuit (IC) including circuit elements, the apparatus comprising:
A method for a computing device to generate an identification number of an integrated circuit (IC) including circuit elements, the method comprising:
Dependencies are inferred from the claim text.