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US 8,620,249 B2Granted
Method and system for process, voltage, and temperature (PVT) measurement and calibration
AssigneeBroadcom Corporation
InventorHooman Darabi
Life of this patent
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AssigneeBroadcom Corporation
InventorHooman Darabi
Estimating the term…
In RF transceivers a method and system for process, voltage, and temperature (PVT) measurement and calibration are provided. A nominal DC offset current may be generated at a nominal temperature and may be based on a calibration voltage. A nominal transconductance parameter may be determined based on the nominal DC offset current and the calibration voltage. The nominal transconductance may be stored and may be utilized to determine temperature and process conditions during operation. In another embodiment, a plurality of DC offset currents may be generated at different temperatures and these generated DC offset currents may be based on a calibration voltage. The calibration voltage may be constant over the range of temperatures. Transconductance parameters may be determined based on the DC offset currents and the calibration voltage. The transconductance parameters may be stored and may be utilized to determine temperature and process conditions during operation.
A method for process, voltage, and temperature (PVT) measurement and calibration, the method comprising:
A method for process, voltage, and temperature (PVT) measurement and calibration, the method comprising:
A system for process, voltage, and temperature (PVT) measurement and calibration, the system comprising:
A system for process, voltage, and temperature (PVT) measurement and calibration, the system comprising:
A machine-readable storage having stored thereon, a computer program having at least one code for process, voltage, and temperature (PVT) measurement and calibration, the at least one code being executable by a machine for causing the machine to perform steps comprising:
A machine-readable storage having stored thereon, a computer program having at least one code for process, voltage, and temperature (PVT) measurement and calibration, the at least one code being executable by a machine for causing the machine to perform steps comprising:
A method for process, voltage, and temperature (PVT) measurement and calibration, the method comprising:
A method for process, voltage, and temperature (PVT) measurement and calibration, the method comprising:
A system for process, voltage, and temperature (PVT) measurement and calibration, the system comprising:
A system for process, voltage, and temperature (PVT) measurement and calibration, the system comprising:
Dependencies are inferred from the claim text.
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From the US filing history. Foreign family members aren’t listed.
DC level restoring means; Bias distortion correction ; Decision circuits providing symbol by symbol detection: providing hard decisions only;…
By converting the oscillations into two quadrature related signals: compensating DC offsets
Circuits: for homodyne or synchrodyne receivers
Arrangements for coupling to transmission lines: arrangements for coupling to multiple lines, e.g. for differential transmission
About 2 months of term left · ends 6 Jan 2027 (estimated)
This application is related to the following applications, each of which is incorporated herein by reference in its entirety for all purposes: U.S. patent application Ser. No. 10/976,976 filed Oct. 29, 2004; U.S. patent application Ser. No. 10/976,977 filed Oct. 29, 2004; U.S. patent application Ser. No. 10/976,575 filed Oct. 29, 2004; U.S. patent application Ser. No. 10/977,464 filed Oct. 29, 2004: U.S. patent application Ser. No. 10/977,798 filed Oct. 29, 2004; U.S. patent application Ser. No. 10/977,005 filed Oct. 29, 2004; U.S. patent application Ser. No. 10/977,771 filed Oct. 29, 2004; U.S. patent application Ser. No. 10/977,868 filed Oct. 29, 2004; U.S. patent application Ser. No. 10/976,666 filed Oct. 29, 2004; U.S. patent application Ser. No. 10/977,631 filed Oct. 29, 2004; U.S. patent application Ser. No. 10/976,639 filed Oct. 29, 2004; U.S. patent application Ser. No. 10/977,210 filed Oct. 29, 2004; U.S. patent application Ser. No. 10/977,872 filed Oct. 29, 2004; U.S. patent application Ser. No. 10/977,869 filed Oct. 29, 2004; U.S. patent application Ser. No. 10/977,874 filed Oct. 29, 2004; and U.S. patent application Ser. No. 10/976,996 filed Oct. 29, 2004.
Not applicable.
Not applicable.
FIG. 1 is a block diagram of an exemplary RF transceiver system, in accordance with an embodiment of the invention.
FIG. 2 is a block diagram of an exemplary RF transceiver system illustrating a lookup table, in accordance with an embodiment of the invention.
FIG. 3 is a block diagram that illustrates a receiver portion of an exemplary transceiver front end, in accordance with an embodiment of the invention.
Certain embodiments of the invention may be found in a method and system for a process, voltage, and temperature (PVT) measurement and calibration. By determining a nominal value of the transconductance parameter β during a nominal set of operating conditions, readings on current conditions may be compared to those for the nominal conditions to determine whether temperature variations and/or process variations had taken place and what means may be utilized to compensate for these variations. In this regard, a DCT offset sensor and current injection circuits may be utilized to perform these measurements. Since the DC offset sensor and the current injection circuits may be utilized in various other operations in a radio frequency (RF) transceiver, this solution provides an efficient and accurate approach that may be utilized to optimize the operation of the RF transceiver as operating conditions vary.
FIG. 1 is a block diagram of an exemplary RF transceiver system, in accordance with an embodiment of the invention. Referring to FIG. 1, the RF transceiver system 100 may comprise a transceiver front end 102, a transceiver back end 104, a controller/processor 106, and a system memory 108. The transceiver front end 102 may comprise suitable logic, circuitry, and/or code that may be adapted to receive and/or transmit an RF signal. The transceiver front end 102 may comprise a receiver portion and a transmitter portion. Both the transmitter portion and the receiver portion may be coupled to an external antenna for signal broadcasting and signal reception respectively. The transceiver front end 102 may modulate a signal for transmission and may also demodulate a received signal before further processing of the received signal is to take place. Moreover, the transceiver front end 102 may provide other functions, for example, digital-to-analog conversion, analog-to-digital conversion, frequency downsampling, frequency upsampling, and/or filtering.
The transceiver back end 104 may comprise suitable logic, circuitry, and/or code that may be adapted to digitally process received signals from the transceiver front end 104 and/or to process signals received from at least one processing block, which may be located external to the RF transceiver system 100. The controller/processor 106 may comprise suitable logic, circuitry, and/or code that may be adapted to control the operations of the transceiver front end 102 and/or the transceiver back end 104. For example, the controller/processor 106 may be utilized to update and/or modify programmable parameters and/or values in a plurality of components, devices, and/or processing elements in the transceiver front end 102 and/or in the transceiver back end 104. Control and/or data information may be transferred from at least one controller and/or processor external to the RF transceiver system 100 to the controller/processor 106 during the operation of the RF transceiver system 100. Moreover, the controller/processor 106 may also transfer control and/or data information to at least one controller and/or processor external to the RF transceiver system 100.