Terahertz scanning reflectometer
OwnerAnis Rahman, Aunik K. Rahmaninventors
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Abstract
A terahertz scanning reflectometer is described herein. A high sensitivity terahertz scanning reflectometer is used to measure dynamic surface deformation and delamination characteristics in real-time. A number of crucial parameters can be extracted from the reflectance measurements such as dynamic deformation, propagation velocity, and final relaxation position. A terahertz reflectometer and spectrometer are used to determine the permeation kinetics and concentration profile of active ingredients in stratum corneum.
Claims16
A terahertz scanning reflectometer for direct measurement of diffusion kinetics and concentration gradient of a substrate, comprising:
- a platform configured to hold the substrate;
- a continuous wave terahertz source configured to generate terahertz radiation;
- an off-axis parabolic reflector configured to focus the terahertz radiation at a surface of the substrate;
- a beam splitter configured to direct a reflected beam from the substrate to a detection system;
- and
- a motion controller configured to move the platform,
- wherein on a condition that the motion controller adjusts a location of a focal point inside the substrate, a reflectance measurement is performed across a thickness of the substrate, wherein a concentration gradient is determined from a blank substrate measurement and a substance loaded substrate measurement, and
- wherein on a condition that the motion controller locks the focal point at the surface of the substrate, a real time reflectance measurement is performable upon placement of the substance on the substrate.
A terahertz dynamic reflectometer for high speed kinetics measurements of a target, comprising:
- a continuous wave terahertz source configured to generate terahertz radiation toward the target;
- and
- a detection system for measuring a transient reflective beam from the target upon impact by a ballistic, wherein the terahertz source and the detection system are angularly positioned outside of a ballistic trajectory.
A terahertz scanning reflectometer for diagnosing a disease condition of a sample, comprising:
- a platform configured to hold the sample;
- a continuous wave terahertz source configured to generate terahertz radiation;
- an off-axis parabolic reflector configured to focus the terahertz radiation at a surface of the sample;
- a beam splitter configured to direct a reflected beam from the sample to a detection system;
- and
- a motion controller configured to move the platform,
- wherein on a condition that the motion controller adjusts a location of a focal point inside the sample, a reflectance measurement is performed across a thickness of the sample, wherein a spectrum is generated at the focal point and compared against a healthy sample to diagnose the disease condition.
Dependencies are inferred from the claim text.