On-die termination circuit, memory device, memory module, and method of operating and training an on-die termination
AssigneeSamsung Electronics Co., Ltd.
InventorYoung-Jin Jeon
Life of this patent
Estimating the term…
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AssigneeSamsung Electronics Co., Ltd.
InventorYoung-Jin Jeon
Estimating the term…
An on-die termination (ODT) circuit of a memory device comprising: a memory device having a memory core having a memory cell array; a data input/output pin connected to the memory core through a data buffer; and an on-die termination (ODT) circuit, comprising: a termination circuit configured to provide a termination impedance at the input/output data pin, the termination circuit having a switching device that selectively connects a termination impedance to the input/output data pin based on the presence of an asynchronous control signal (ACS), wherein the ACS is generated based on the presence of a memory WRITE command. The memory device may further comprise a training circuit comprising: an asynchronous signal delay configured to delay the signal path of the ACS signal to the termination circuit; and a comparing unit configured to compare a phase difference between the ACS signal and a reference signal, the comparing unit comprising a phase detector and a replica delay, wherein the replica delay is configured to delay the signal path of the ACS signal to the phase detector, and the phase detector is configured to output the phase difference as training result.
An on-die termination (ODT) circuit, comprising:
An on-die termination (ODT) circuit, comprising:
A method of providing termination impedance at an input/output data line of a memory device, comprising:
Dependencies are inferred from the claim text.