FTP memory device with programming and erasing based on Fowler-Nordheim effect
AssigneeSTMicroelectronics S.r.l.
InventorsMarco Pasotti, Marcella Carissimi, Davide Lena
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AssigneeSTMicroelectronics S.r.l.
InventorsMarco Pasotti, Marcella Carissimi, Davide Lena
Estimating the term…
An embodiment of a non-volatile memory device integrated in a chip of semiconductor material is proposed. The memory device includes a plurality of memory cells. Each memory cell includes a first well and a second well of first type of conductivity that are formed in an insulating region of a second type of conductivity. The memory cell further includes a first, a second, a third and a fourth region of the second type of conductivity that are formed in the first well; these regions define a sequence of a first selection transistor of MOS type, a storage transistor of floating gate MOS type, and a second selection transistor of MOS type that are coupled in series. The first region is short-circuited to the first well. Moreover, the memory device includes a first gate of the first selection transistor, a second gate of the second selection transistor, and a floating gate of the storage transistor. A control gate of the storage transistor is formed in the second well; the control gate is capacitively coupled with the floating gate.
A non-volatile memory device integrated in a chip of semiconductor material, the memory device comprising:
A non-volatile memory cell, comprising:
A non-volatile memory cell, comprising:
A non-volatile memory cell, comprising:
A memory array, comprising:
A memory array, comprising:
A system, comprising:
A system, comprising:
A method, comprising:
A method, comprising:
Dependencies are inferred from the claim text.