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US 8,619,252 B2Granted
Microscope including a light intensity measuring unit for measuring an intensity of light emitted from the microscope
AssigneeOlympus Corporation
InventorEiji Nakasho
Life of this patent
Estimating the term…
Abstract
A light intensity measuring unit for measuring an intensity of light emitted from a microscope includes an aperture stop, a field stop, at least one measurement lens arranged between the aperture stop and the field stop, and an interface for attachment to a microscope. The aperture stop is positioned on or close to a back focal plane of the at least one measurement lens. The field stop is positioned on or close to a front focal plane of the at least one measurement lens.
Claims16
A microscope, comprising:
- an objective;
- and
- a light intensity measuring unit for measuring an intensity of light emitted from the microscope, the light intensity measuring unit comprising:
- an aperture stop arranged on or close to a plane corresponding to a back focal plane of the objective during observation;
- a field stop arranged on or close to a plane corresponding to a front focal plane of the objective during observation;
- at least one measurement lens arranged between the aperture stop and the field stop;
- an interface for attachment to the microscope;
- and
- a photodetector for measuring a light intensity,
- wherein:
- the field stop is positioned on or close to a front focal plane of the at least one measurement lens, and positioned between the at least one measurement lens and the photodetector;
- the aperture stop is positioned on or close to a back focal plane of the at least one measurement lens;
- and
- the light intensity measuring unit is installed in the microscope such that light equivalent to light incident on the objective during observation enters the aperture stop.
11 more elements
Dependencies are inferred from the claim text.